MIC5013_05 Datasheet, PDF (3/15 Pages) Micrel Semiconductor – Protected High- or Low-Side MOSFET Driver

MIC5013
Micrel, Inc.
Electrical Characteristics (Note 3, 5)
Test circuit. T_A = –55°C to +125°C, V⁺ = 15V, all switches open, unless otherwise specified.
Parameter
Supply Current, I₇
Logic Input Voltage, V_IN
Logic Input Current, I₁
Input Capacitance
Conditions
V⁺ = 32V
V⁺ = 4.75V
V⁺ =15V
V+ = 32V
Pin 1
V_IN = 0V, S4 closed
V_IN = V_S = 32V
Adjust V_IN for V_GATE low
Adjust V_IN for V_GATE high
Adjust V_IN for V_GATE high
V_IN = 0V
V_IN = 32V
Min Typical Max
0.1
10
8
20
2
4.5
5.0
–1
1
5
Units
µA
mA
V
V
V
µA
µA
pF
Gate Drive, V_GATE
Zener Clamp,
V_GATE – V_SOURCE
Gate Turn-on Time, t_ON
µs
(Note 4)
Gate Turn-off Time, t_OFF
Threshold Bias Voltage, V₂
Current Sense Trip Voltage,
V_SENSE – V_SOURCE
S1, S2 closed,
V⁺ = 7V, I₆ = 0
V_S = V+, V_IN = 5V
V⁺ = 15V, I₆ = 100 µA
S2 closed, V_IN = 5V V+ = 15V, V_S = 15V
V⁺ = 32V, V_S = 32V
V_IN switched from 0 to 5V; measure time
for V_GATE to reach 20V
V_IN switched from 5 to 0V; measure time
for V_GATE to reach 1V
I₂ = 200 µA
S2 closed, V_IN = 5V,
V⁺ = 7V,
S4 closed
Increase I₃
I₂ = 100 µA
V⁺ = 15V
V_S = 4.9V, S4 open
S4 closed
13
15
V
24
27
V
11 12.5 15
V
11
13
16
V
60
200
4
10
µs
1.7
2
2.2
V
75
105 135
mV
70
100 130
mV
150 210 270 mV
I₂ = 200 µA V_S = 11.8V, S4 open
140
200
260
mV
V⁺ = 32V
V_S = 0V, S4 open
360 520 680 mV
I₂ = 500 µA V_S = 25.5V, S4 open
350
500
650
mV
Peak Current Trip Voltage,
V_SENSE – V_SOURCE
S3, S4 closed,
V⁺ = 15V, V_IN = 5V
1.6
2.1
V
Fault Output Voltage, V₈
V_IN = 0V, I₈ = –100 µA
0.4
1
V
V_IN = 5V, I₈ = 100 µA, current sense tripped
14 14.6
V
Note 1. Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when
operating the device beyond its specified Operating Ratings.
Note 2. The MIC5010 is ESD sensitive.
Note 3. Minimum and maximum Electrical Characteristics are 100% tested at T_A = 25°C and T_A = 85°C, and 100% guaranteed over the entire
range. Typicals are characterized at 25°C and represent the most likely parametric norm.
Note 4. Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see
Applications Information.
Note 5. Specification for packaged product only.
July 2005
3
MIC5013