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MIC5012 Datasheet, PDF (3/9 Pages) Micrel Semiconductor – Dual High- or Low-Side MOSFET Driver Not Recommended for New Designs
MIC5012
Micrel
Electrical Characteristics (Note 3) Test circuit. TA = –55°C to +125°C, V+ = 15V, all switches open, unless
otherwise specified.
Parameter
Conditions
Min Typical Max Units
Supply Current
(per section)
Logic Input Voltage
Logic Input Current, I2
Input Capacitance
V+ = 32V
V+ = 5V
V+ = 4.75V
V+ = 15V
V+ = 32V
Pins 11, 14
VIN = 0V, S2 closed
VIN = VS = 32V
VIN = 5V, S2 closed
Adjust VIN for VGATE low
Adjust VIN for VGATE high
Adjust VIN for VGATE high
VIN = 0V
VIN = 32V
0.1
10
µA
8
20
mA
1.6
4
mA
2
V
4.5
V
5.0
V
–1
µA
1
µA
5
pF
Gate Drive, VGATE
Zener Clamp,
VGATE – VSOURCE
Gate Turn-on Time, tON
(Note 4)
Gate Turn-off Time, tOFF
S1, S2 closed,
VS = V+, VIN = 5V
S2 closed, VIN = 5V
V+ = 4.75V, IGATE = 0, VIN = 4.5V
V+ = 15V, IGATE = 100µA, VIN = 5V
V+ = 15V, VS = 15V
V+ = 32V, VS = 32V
VIN switched from 0 to 5V; measure time
for VGATE to reach 20V
VIN switched from 5 to 0V; measure time
for VGATE to reach 1V
7
10
V
24
27
V
11 12.5 15
V
11
13
16
V
60
200
µs
4
10
µs
Note 1
Note 2
Note 3
Note 4
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when
operating the device beyond its specified Operating Ratings.
The MIC5012 is ESD sensitive.
Minimum and maximum Electrical Characteristics are 100% tested at TA = 25°C and TA = 85°C, and 100% guaranteed over the entire
range. Typicals are characterized at 25°C and represent the most likely parametric norm.
Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see
Applications Information. Maximum value of switching speed seen at 125°C, units operated at room temperature will reflect the typical
values shown.
Test Circuit
V+
+ 1µF
1/2 MIC5012
V+
Input
V IN
Source
500Ω
1W
Gnd Gate
VGATE
S2
1nF S1
VS
I GATE
5-116
April 1998