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MIC5011_05 Datasheet, PDF (3/12 Pages) Micrel Semiconductor – Minimum Parts High- or Low-Side MOSFET Driver
MIC5011
Micrel, Inc.
Electrical Characteristics (Note 3)
Test circuit. TA = –55°C to +125°C, V+ = 15V, all switches open, unless otherwise specified.
Parameter
Conditions
Min Typical Max Units
Supply Current, I1
Logic Input Voltage
Logic Input Current, I2
Input Capacitance
V+ = 32V
V+ = 5V
V+ = 4.75V
V+ = 15V
V+ = 32V
Pin 2
VIN = 0V, S2 closed
VIN = V+ = 32V
VIN = 5V, S2 closed
Adjust VIN for VGATE low
Adjust VIN for VGATE high
Adjust VIN for VGATE high
VIN = 0V
VIN = 32V
0.1
10
µA
8
20
mA
1.6
4
mA
2
V
4.5
V
5.0
V
–1
µA
1
µA
5
pF
Gate Drive, VGATE
Zener Clamp,
VGATE – VSOURCE
Gate Turn-on Time, tON
(Note 4)
Gate Turn-off Time, tOFF
S1, S2 closed,
VS = V+, VIN = 5V
S2 closed, VIN = 5V
V+ = 4.75V, IGATE = 0, VIN = 4.5V
V+ = 15V, IGATE = 100µA, VIN = 5V
V+ = 15V, VS = 15V
V+ = 32V, VS = 32V
VIN switched from 0 to 5V; measure time
for VGATE to reach 20V
VIN switched from 5 to 0V; measure time
for VGATE to reach 1V
7
10
V
24
27
V
11 12.5 15
V
11
13
16
V
25
50
µs
4
10
µs
Note 1 Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when
operating the device beyond its specified Operating Ratings.
Note 2 The MIC5011 is ESD sensitive.
Note 3 Minimum and maximum Electrical Characteristics are 100% tested at TA = 25°C and TA = 85°C, and 100% guaranteed over the entire
range. Typicals are characterized at 25°C and represent the most likely parametric norm.
Note 4
Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see Appli-
cations Information. Maximum value of switching speed seen at 125°C, units operated at room temperature will reflect the typical values
shown.
Test Circuit
V+
+ 1µF
MIC5011
1 V+
C1 8
1nF
2 Input Com 7
V IN
3 Source C2 6
1nF
500Ω
1W
4 Gnd
Gate 5
VGATE
S2
1nF S1
VS
I5
July 2005
3
MIC5011