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MIC5011 Datasheet, PDF (3/12 Pages) Micrel Semiconductor – Minimum Parts High- or Low-Side MOSFET Driver
MIC5011
Micrel
Electrical Characteristics (Note 3) Test circuit. TA = –55°C to +125°C, V+ = 15V, all switches open, unless
otherwise specified.
Parameter
Conditions
Min Typical Max Units
Supply Current, I1
Logic Input Voltage
Logic Input Current, I2
Input Capacitance
V+ = 32V
V+ = 5V
V+ = 4.75V
V+ = 15V
V+ = 32V
Pin 2
VIN = 0V, S2 closed
VIN = V+ = 32V
VIN = 5V, S2 closed
Adjust VIN for VGATE low
Adjust VIN for VGATE high
Adjust VIN for VGATE high
VIN = 0V
VIN = 32V
0.1
10
µA
8
20
mA
1.6
4
mA
2
V
4.5
V
5.0
V
–1
µA
1
µA
5
pF
Gate Drive, VGATE
Zener Clamp,
VGATE – VSOURCE
Gate Turn-on Time, tON
(Note 4)
Gate Turn-off Time, tOFF
S1, S2 closed,
VS = V+, VIN = 5V
S2 closed, VIN = 5V
V+ = 4.75V, IGATE = 0, VIN = 4.5V
V+ = 15V, IGATE = 100µA, VIN = 5V
V+ = 15V, VS = 15V
V+ = 32V, VS = 32V
VIN switched from 0 to 5V; measure time
for VGATE to reach 20V
VIN switched from 5 to 0V; measure time
for VGATE to reach 1V
7
10
V
24
27
V
11 12.5 15
V
11
13
16
V
25
50
µs
4
10
µs
Note 1
Note 2
Note 3
Note 4
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when
operating the device beyond its specified Operating Ratings.
The MIC5011 is ESD sensitive.
Minimum and maximum Electrical Characteristics are 100% tested at TA = 25°C and TA = 85°C, and 100% guaranteed over the entire
range. Typicals are characterized at 25°C and represent the most likely parametric norm.
Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see
Applications Information. Maximum value of switching speed seen at 125°C, units operated at room temperature will reflect the typical
values shown.
Test Circuit
V+
+ 1µF
MIC5011
1 V+
C1 8
1nF
2 Input Com 7
V IN
3 Source C2 6
1nF
VGATE
500Ω
1W
4 Gnd
Gate 5
S2
1nF S1
VS
I5
July 2000
3
MIC5011