MIC4123 Datasheet, PDF (3/11 Pages) Micrel Semiconductor – Dual 3A-Peak Low-Side MOSFET Driver

MIC4123/4124/4125
Absolute Maximum Ratings (Note 1)
Supply Voltage ........................................................... +24V
Input Voltage .................................. V_S + 0.3V to GND – 5V
Junction Temperature ................................................150°C
Storage Temperature Range ......................–65°C to 150°C
Lead Temperature (10 sec.) ......................................300°C
ESD Susceptability, Note 3
Micrel, Inc.
Operating Ratings (Note 2)
Supply Voltage (V_S) ......................................+4.5V to +20V
Junction Temperature Range .....................–40°C to 125°C
Package Thermal Resistance
4mm X 4mm MLF θ_JA ......................................... 45°C/W
EPAD SOIC-8L θ_JA ............................................. 58°C/W
MIC4123/4124/4125 Electrical Characteristics ^{(Note 4)}
4.5V ≤ V_S ≤ 20V; T_A = 25°C, bold values indicate –40°C ≤ T_J ≤ +125°C; unless noted. Input Voltage slew rate >2.5V/µs.
Symbol
Parameter
Conditions
Min Typ Max
Input
V_IH
Logic 1 Input Voltage
V_IL
Logic 0 Input Voltage
I_IN
Input Current
0V ≤ V_IN ≤ V_S
2.4
1.5
1.3
0.8
–1
1
–10
10
Output
V_OH
High Output Voltage
I_OUT = 100µA
V_OL
Low Output Voltage
I_OUT = –100µA
R_O
Output Resistance HI State
I_OUT = 10mA, V_S = 20V
V_S–0.025
2.3
0.025
5
8
Output Resistance LO State
I_OUT = 10mA, V_S = 20V
2.2
5
8
I_PK
Peak Output Current
I
Latch-Up Protection
Withstand Reverse Current
3
>200
Switching Time
t_R
Rise Time
test Figure 1, C_L = 1800pF
11
35
60
t_F
Fall Time
test Figure 1, C_L = 1800pF
11
35
60
t_D1
Delay Tlme
test Ffigure 1, C_L = 1800pF
44
75
100
t_D2
Delay Time
test Figure 1, C_L = 1800pF
59
75
100
Power Supply
I_S
Power Supply Current
V_IN = 3.0V (both inputs)
1.5
2.5
3.5
I_S
Power Supply Current
V_IN = 0.0V (both inputs)
0.15 0.25
0.3
Note 1.
Note 2.
Note 3.
Note 4.
Exceeding the absolute maximum rating may damage the device.
The device is not guaranteed to function outside its operating rating.
Devices are ESD sensitive. Handling precautions recommended. ESD tested to human body model, 1.5k in series with 100pF.
Specification for packaged product only.
Units
V
V
µA
µA
V
V
Ω
Ω
Ω
Ω
A
mA
ns
ns
ns
ns
ns
ns
ns
ns
mA
mA
mA
mA
May 2005
3
M9999-052405