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MIC4423_11 Datasheet, PDF (3/13 Pages) MIC GROUP RECTIFIERS – Dual 3A-Peak Low-Side MOSFET Driver Bipolar/CMOS/DMOS Process
MIC4423/4424/4425
Absolute Maximum Ratings (Note 1)
Supply Voltage ........................................................... +22V
Input Voltage .................................. VS + 0.3V to GND – 5V
Junction Temperature ................................................150°C
Storage Temperature Range ......................–65°C to 150°C
Lead Temperature (10 sec.) ......................................300°C
ESD Susceptability, Note 3 ..................................... 1000V
Micrel, Inc.
Operating Ratings (Note 2)
Supply Voltage (VS) ......................................+4.5V to +18V
Temperature Range
C Version ....................................................0°C to +70°C
B Version ................................................–40°C to +85°C
Package Thermal Resistance
DIP θJA ............................................................. 130°C/W
DIP θJC ............................................................... 42°C/W
Wide-SOIC θJA ................................................. 120°C/W
Wide-SOIC θJC ................................................... 75°C/W
SOIC θJA ........................................................... 120°C/W
SOIC θJC ............................................................ 75°C/W
MIC4423/4424/4425 Electrical Characteristics (Note 5)
4.5V ≤ VS ≤ 18V; TA = 25°C, bold values indicate –40°C ≤ TA ≤ +85°C; unless noted.
Symbol
Parameter
Conditions
Input
VIH
Logic 1 Input Voltage
VIL
Logic 0 Input Voltage
IIN
Input Current
0V ≤ VIN ≤ VS
Output
VOH
VOL
RO
High Output Voltage
Low Output Voltage
Output Resistance HI State
Output Resistance LO State
IPK
Peak Output Current
I
Latch-Up Protection
Withstand Reverse Current
Switching Time (Note 4)
tR
Rise Time
IOUT = 10mA, VS = 18V
VIN = 0.8V, IOUT = 10mA, VS = 18V
IOUT = 10mA, VS = 18V
VIN = 2.4V, IOUT = 10mA, VS = 18V
test Figure 1, CL = 1800pF
tF
Fall Time
test Figure 1, CL = 1800pF
tD1
Delay Tlme
test Ffigure 1, CL = 1800pF
tD2
Delay Time
test Figure 1, CL = 1800pF
tPW
Pulse Width
Power Supply
IS
Power Supply Current
test Figure 1
VIN = 3.0V (both inputs)
IS
Power Supply Current
VIN = 0.0V (both inputs)
Min Typ Max
2.4
0.8
–1
1
–10
10
VS–0.025
2.8
3.7
3.5
4.3
3
>500
0.025
5
8
5
8
23
35
28
60
25
35
32
60
33
75
32
100
38
75
38
100
400
1.5
2.5
2
3.5
0.15 0.25
0.2
0.3
Note 1.
Note 2.
Note 3.
Note 4.
Note 5.
Exceeding the absolute maximum rating may damage the device.
The device is not guaranteed to function outside its operating rating.
Devices are ESD sensitive. Handling precautions recommended. ESD tested to human body model, 1.5k in series with 100pF.
Switching times guaranteed by design.
Specification for packaged product only.
Units
V
V
µA
µA
V
V
Ω
Ω
Ω
Ω
A
mA
ns
ns
ns
ns
ns
ns
ns
ns
ns
mA
mA
mA
mA
July 2005
3
MIC4423/4424/4425