TH8056_12 Datasheet, PDF (30/34 Pages) Melexis Microelectronic Systems – Enhanced Single Wire CAN Transceiver

TH8056
Enhanced Single Wire CAN Transceiver
7. ESD/EMC Remarks
7.1 General Remarks
Electronic semiconductor products are sensitive to Electro Static Discharge (ESD).
Always observe Electro Static Discharge control procedures whenever handling semiconductor products.
7.2 ESD-Test
The TH8056 is tested according to MIL883D (human body model).
7.3 EMC
The test on EMC impacts is done according to ISO 7637-1 for power supply pins and ISO 7637-3 for data-
and signal pins.
Power Supply pin VBAT, CANH, LOAD:
Testpulse
Condition
1
t1 = 5 s / US = -100 V / tD = 2 ms
2
t1 = 0.5 s / US = 100 V / tD = 0.05 ms
3a/b
US = -200 V/ US = 200 V
burst 100ns / 10 ms / 90 ms break
5
Ri = 0.5 Ω, tD = 400 ms
tr = 0.1 ms / UP+US = 40 V
Duration
5000 pulses
5000 pulses
1h
10 pulses every 1min
7.4 Latch Up Test
The TH8056 is tested according to JESD78 (Class 2).
TH8056 – Datasheet
3901008056
Page 30 of 34
June 2012
Rev 014