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PSKD200E12 Datasheet, PDF (1/1 Pages) Meder Electronic – Fast Recovery Epitaxial Diode Module
Fast Recovery
Epitaxial Diode
(FRED) Module
PSKD 200E
IFAV
VRRM
= 312 A
= 800-1200V
Preliminary Data Sheet
VRSM
V
800
1000
1200
VRRM
V
800
1000
1200
Type
PSKD 200E/08
PSKD 200E/10
PSKD 200E/12
Symbol
IFAV
IFSM
∫ i2 dt
TVJ
TVJM
Tstg
VISOL
Md
Weight
Test Conditions
TC = 70°C
TVJ = 45°C
t = 10 ms
VR = 0
t = 8.3 ms
(50 Hz), sine
(60 Hz), sine
Maximum Ratings
312
A
3200
A
3500
A
TVJ = TVJM
t = 10 ms (50 Hz), sine
2900
A
VR = 0
t = 8.3 ms (60 Hz), sine
3200
A
TVJ = 45°C
t = 10 ms (50 Hz), sine
51200
A2 s
VR = 0
t = 8.3 ms (60 Hz), sine
50800
A2 s
TVJ = TVJM
VR = 0
t = 10 ms (50 Hz), sine
42000
A2 s
t = 8.3 ms (60 Hz), sine
42500
A2 s
-40 ... + 150
°C
150
°C
-40 ... + 125
°C
50/60 HZ, RMS t = 1 min
IISOL ≤ 1 mA
t=1s
Mounting torque
Terminal connection torque
(M6)
(M6)
2500
V∼
3000
V∼
5
Nm
5
Nm
typ.
270
g
Symbol
IR
VF
trr
VTO
rT
RthJC
RthJH
dS
dA
a
Test Conditions
VR = VRRM
VR = VRRM
IF = 200 A
TVJ = 25°C
TVJ = 25°C
TVJ = TVJM
TVJ = 25°C
For power-loss calculations only
TVJ = TVJM
per diode; DC current
per module
per diode; DC current
per module
Creeping distance on surface
Creeping distance in air
Max. allowable acceleration
Characteristic Value
≤
3.4
mA
≤
35
mA
≤
1.55
V
typ. 150
ns
0.3
V
0.75
mΩ
0.28
K/W
0.14
0.38
K/W
0.19
10
mm
9.4
mm
50
m/s2
Features
• Package with screw terminals
• Isolation voltage 3000 V∼
• Planar glasspassivated chips
• Short recovery time
• Low forward voltage drop
• Short recovery behaviour
• UL registered, E 148688
Applications
• Inductive heating and melting
• Free wheeling diode in converters
and motor control circuits
• Uninterruptible power supplies
(UPS)
• Ultrasonic cleaners and welders
Advantages
• High reliability circuit operation
• Low voltage peaks for reduced
protection circuits
• Low noise switching
• Low losses
Package, style and outline
Dimensions in mm (1mm = 0.0394“)
POWERSEM GmbH, Walpersdorfer Str. 53
91126 D- Schwabach
Phone: 09122 - 9764-0 Fax.: 09122 - 9764-20
 2003 POWERSEM reserves the right to change limits, test conditions and dimensions