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MX29NS320E Datasheet, PDF (56/70 Pages) Macronix International – 128/64/32M-BIT [8/4/2M x16-bit] CMOS 1.8 Volt-only,
MULTIPLEXED, Burst Mode, Flash Memory
10-3. Test Conditions
Figure 10. Test Setup
DEVICE UNDER
TEST
CL
6.2KΩ
1.8V
2.7KΩ
Testing Conditions:
• Output Load Capacitance, CL : 1TTL gate, 10pF
• Rise/Fall Times : 2ns
• Input Pulse levels :0.0 ~ VI/O
• In/Out reference levels :0.5VI/O
Figure 11. Input Waveforms and Measurement Levels
VI/O
0.0 V
Input
VI/O /2
Measurement Level
VI/O/2
Output
P/N: PM1585
REV. 1.1, APR. 26, 2011
56