HSN2000 Datasheet, PDF (1/4 Pages) Maxwell Technologies – Nuclear Event Detector

HSN-2000
Nuclear Event Detector
V_B
Threshold
8
9 ^Adjust
Detector
(Pin Diode)
Amplifier
V_H
14
Pulse Timer
BIT 6
LED
7
GND
5
4
C
RC
Logic Diagram
V_L
1
10 kΩ
2 NED
Logic
Latch
12
Flag
Reset
10 kΩ
13 NEF
11 ^Flag
Reset
FEATURES:
• Detects ionizing radiation pulses
• Tested/certified detection threshold level
• Adjustable circumvention period
• 100% testable with built-in test
• Detection threshold adjustability
• Single +5V operation
• Designed-in radiation hardness
• Compliant to MIL-PRF-38534 Class H¹
• Flat pack (F) or DIP (L) packages
RADIATION HARDNESS
CHARACTERISTICS
• Dose Rate (operate-through): 1 x 10¹² rad(Si)/sec
• Total Dose: 1 x 10⁶ rad(Si)
• Neutron Fluence: 5 x 10¹³ n/cm²
• Approximate Detection Range: 2 x 10⁵ - 2 x 10⁷ rad(Si)/sec
• Maxwell Technologies Specified, Controlled, and Tested
DESCRIPTION:
Maxwell Technologies’ HSN-2000 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its output from the normal high
state to a low state with a propagation delay time of less than 20
ns. The active low Nuclear Event Detection signal (NED) is used
to initiate a wide variety of circumvention functions, thus prevent-
ing upset and burnout of electronic components. The NED output
is also used to initiate both hardware and software recovery. This
high-speed, 14-pin hybrid detector is used in electronic systems
as a general-purpose circumvention device to protect memory,
stop data processing, and drive power supply switches as well as
signal clamps.
The HSN-2000 is designed to operate through three critical envi-
ronments: ionizing dose rate [10¹² rad(Si)/s], gamma total dose
[10⁶ rad(Si)], and neutron fluence [5 x 10¹³ n/cm²]. In addition, the
device is designed to function throughout the transient neutron
pulse. The hybrid’s discrete design ensures a controlled response
in these radiation environments as well as immunity to latchup.
The detection level and functionality of a sample of each HSN-
2000 production lot are tested in an ionizing dose rate environ-
ment. A certificate is provided reporting the test results for the
production lot.
The detection threshold of the HSN-2000 is adjustable within the
range of 2 x 10⁵ rad(Si)/s to 2 x 10⁷ rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.
1. Manufactured for Maxwell Technologies by Teledyne Microelectronic
Technologies to MIL-PRF-38534, Class H, no RHA
01.07.05 Rev 3
[phone] - Fax: [phone] - www.maxwell.com
All data sheets are subject to change without notice 1
©2005 Maxwell Technologies
All rights reserved.