DG300 Datasheet, PDF (5/10 Pages) Maxim Integrated Products – TTL Compatible CMOS Analog Switches

TTL Compatible CMOS Analog Switches
Test Circuits
∆V_O
R_GEN
S_X
V_GEN
D_X
IN_X
Figure 1. Charge Injection Test Circuit
V_O
C_L
10nF
V_O
+4V
IN_X
ON
∆V_O = ∆ MEASURED VOLTAGE ERROR DUE TO CHARGE INJECTION
THE ERROR VOLTAGE IN COULOMBS IS ∆Q = C_L x ∆V_O.
ON
OFF
0V
LOGIC
INPUT
0V
VS1
SWITCH
OUTPUT
VO1
0V
LOGIC "1" = SWITCH ON
VIHN
50%
+4V
50%
SWITCH
OUTPUT
VS2
VO2
50%
0V
S1
VS1 = 3V
S2
VS2 = 3V
IN
LOGIC
INPUT
tBBM
Figure 2. Break-Before-Make Time Test Circuit SPDT (DG301(A), DG303(A)
+15V
V+
D1
D2
RL2
RL1
CL2
300Ω 300Ω 33pF
SWITCH
OUTPUT
VO1
VO2
CL1
33pF
GND
V-
-15V
LOGIC
INPUT
t_R < 20ns
t_F < 20ns _0V
V_S
SWITCH
OUTPUT
0V
LOGIC "1" = SWITCH ON
V_IHN
50%
+4V
90%
10%
S
V_S = 3V
IN
LOGIC
INPUT
+15V
V+
0
R_L
C_L
300Ω 33pF
SWITCH
OUTPUT
V_O
GND
V-
-15V
t_ON
t_OFF
Figure 3. Switching Time Test Circuit
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