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MAX1226 Datasheet, PDF (4/24 Pages) Maxim Integrated Products – 12-Bit 300ksps ADCs with FIFO, Temp Sensor, Internal Reference
12-Bit 300ksps ADCs with FIFO,
Temp Sensor, Internal Reference
ELECTRICAL CHARACTERISTICS (continued)
(VDD = +5V ±5%, fSAMPLE = 300kHz, fSCLK = 4.8MHz (50% duty cycle), VREF = 4.096V, TA = TMIN to TMAX, unless otherwise noted.
Typical values are at TA = +25°C.)
PARAMETER
SYMBOL
DIGITAL INPUTS (SCLK, DIN, CS, CNVST)
Input Voltage Low
VIL
Input Voltage High
VIH
Input Hysteresis
VHYST
Input Leakage Current
IIN
Input Capacitance
CIN
DIGITAL OUTPUTS (DOUT, EOC)
Output Voltage Low
VOL
Output Voltage High
Tri-State Leakage Current
Tri-State Output Capacitance
POWER REQUIREMENTS
Supply Voltage
VOH
IL
COUT
VDD
Supply Current (Note 8)
IDD
Power-Supply Rejection
PSR
CONDITIONS
VIN = 0 or VDD
ISINK = 2mA
ISINK = 4mA
ISOURCE = 1.5mA
CS = VDD
CS = VDD
During temp sense
Internal
reference
fSAMPLE = 300ksps
fSAMPLE = 0, REF on
Shutdown
External
reference
During temp sense
fSAMPLE = 300ksps
Shutdown
VDD = 4.75V to 5.25V; full-scale input
MIN TYP MAX UNITS
0.8
V
2.0
V
200
mV
±0.01 ±1.0
µA
15
pF
0.4
V
0.8
VDD - 0.5
V
±0.05 ±1
µA
15
pF
4.75
5.25
V
2400 3100
1950 2300
1000 1350
0.2
5
µA
1650 2300
1250 1500
0.2
5
±0.2 ±1.2
mV
Note 1: Tested at VDD = +5V, unipolar input mode.
Note 2: Offset nulled.
Note 3: Time for reference to power up and settle to within 1 LSB.
Note 4: Conversion time is defined as the number of clock cycles multiplied by the clock period; clock has 50% duty cycle.
Note 5: The operational input voltage range for each individual input of a differentially configured pair is from GND to VDD. The
operational input voltage difference is from -VREF / 2 to +VREF / 2.
Note 6: See Figure 3 (Input Equivalent Circuit) and the Sampling Error vs. Source Impedance curve in the Typical Operating
Characterisitcs section.
Note 7: Fast automated test, excludes self-heating effects.
Note 8: Supply current is specified depending on whether an internal or external reference is used for voltage conversions.
Temperature measurements always use the internal reference.
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