MAX1114 Datasheet, PDF (2/12 Pages) Maxim Integrated Products – 8-Bit, 150Msps Flash ADC

8-Bit, 150Msps Flash ADC
ABSOLUTE MAXIMUM RATINGS
Negative Supply Voltage (VEE TO GND) ..............-7.0V to +0.5V
Ground Voltage Differential ...................................-0.5V to +0.5V
Analog Input Voltage ...............................................V_EE to +0.5V
Reference Input Voltage ..........................................V_EE to +0.5V
Digital Input Voltage.................................................V_EE to +0.5V
Reference Current VRTF to VRBF.........................................25mA
Digital Output Current ...........................................0mA to -30mA
Operating Temperature Range ...........................-25°C to +85°C
Junction Temperature ......................................................+150°C
Storage Temperature Range .............................-65°C to +150°C
Lead Temperature (soldering, 10sec). ............................+300°C
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(VEE = -5.2V, RSOURCE = 50Ω, VRBF = -2.00V, VR2 = -1.00V, VRTF = 0.00V, fCLK = 150MHz, 50% Duty Cycle, TA = TMIN to TMAX,
unless otherwise noted.)
PARAMETER
CONDITIONS
DC ACCURACY
Integral Linearity
fCLK = 100 kHz
Differential Linearity
fCLK = 100 kHz
No missing codes
ANALOG INPUT
Offset Error VRT
Offset Error VRB
Input Voltage Range
Input Capacitance
Over full input range
Input Resistance
Input Current
Input Slew Rate
Large-Signal Bandwidth
VIN = full scale
Small-Signal Bandwidth
IN = 500mVp-p
REFERENCE INPUT
Ladder Resistance
Reference Bandwidth
TIMING CHARACTERISTICS
Maximum Sample Rate
Clock to Data Delay
Output Delay Tempco
CLK-to-Data Ready Delay (tD)
Aperture Jitter
Acquisition Time
TEST
MAX1114A
LEVEL MIN TYP MAX
MAX1114B
MIN TYP MAX
UNITS
VI
-0.75 ±0.60 +0.75 -0.95 ±0.80 +0.95 LSB
VI
-0.75
+0.75 -0.95
+0.95 LSB
Guaranteed
Guaranteed
IV
-30
+30
-30
+30
mV
IV
-30
+30
-30
+30
mV
VI
-2.0
0.0
-2.0
0.0
V
V
10
10
pF
V
15
15
kΩ
VI
250
500
250
500
µA
V
1,000
1,000
V/µs
V
210
210
MHz
V
335
335
MHz
VI
100
200
300
100
200
300
Ω
V
10
10
MHz
VI
125
150
V
2.4
V
2
V
2.0
V
5
V
1.5
125
150
2.4
2
2.0
5
1.5
Msps
ns
ps/°C
ns
ps
ns
2 _______________________________________________________________________________________