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MAX1062 Datasheet, PDF (14/17 Pages) Maxim Integrated Products – 14-Bit, %V, 200ksps ADC with 10μA Shutdown
14-Bit, +5V, 200ksps ADC with 10µA Shutdown
Table 2. Detailed SSPSTAT Register Contents
CONTROL BIT
MAX1062
SETTINGS
SYNCHRONOUS SERIAL-PORT CONTROL REGISTER (SSPSTAT)
SMP
BIT7
0
SPI Data Input Sample Phase. Input data is sampled at the middle of the data output time.
CKE
BIT6
1
SPI Clock Edge Select Bit. Data will be transmitted on the rising edge of the
serial clock.
D/A
BIT5
P
BIT4
S
BIT3
R/W
BIT2
UA
BIT1
BF
BIT0
X
Data Address Bit
X
Stop Bit
X
Start Bit
X
Read/Write Bit Information
X
Update Address
X
Buffer Full Status Bit
X = Don’t care
SCLK
CS
1ST BYTE READ
DOUT*
0
0
00
0
*WHEN CS IS HIGH, DOUT = HIGH-Z
0
0
0
2ND BYTE READ
12
16
D13 D12 D11 D10 D9 D8 D7
MSB
D6 D5
3RD BYTE READ
20
24
D5 D4 D3 D2 D1 D0 S1 S0
LSB
HIGH-Z
Figure 12b. SPI Interface Timing with PIC16/PIC17 in Master Mode (CKE = 1, CKP = 0, SMP = 0, SSPM3 - SSPM0 =0001)
neously. Three consecutive 8-bit readings (Figure 12b)
are necessary to obtain the entire 14-bit result from the
ADC. DOUT data transitions on the serial clock’s falling
edge and is clocked into the µC on SCLK’s rising edge.
The first 8-bit data stream contains all zeros. The sec-
ond 8-bit data stream contains the MSB through D6.
The third 8-bit data stream contains bits D5 through D0
followed by S1 and S0.
Definitions
Integral Nonlinearity
Integral nonlinearity (INL) is the deviation of the values
on an actual transfer function from a straight line. This
straight line can be either a best-fit straight line fit or a
line drawn between the end points of the transfer func-
tion, once offset and gain errors have been nullified.
The static linearity parameters for the MAX1062 are
measured using the endpoint method.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between
an actual step width and the ideal value of 1LSB. A
DNL error specification of 1LSB guarantees no missing
codes and a monotonic transfer function.
Aperture Definitions
Aperture jitter (tAJ) is the sample-to-sample variation in
the time between samples. Aperture delay (tAD) is the
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