RH137 Datasheet, PDF (3/4 Pages) Linear Technology – Negative Adjustable Regulator

RH137
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 4)
SYMBOL PARAMETER
CONDITIONS
10KRAD(Si)
NOTES MIN MAX
I_ADJ
I _ADJ
I_MIN
Adjust Pin Current
Adjust Pin Current Change
Minimum Load Current
Current Limit H Package
K Package
10mA I _OUT I _MAX
3V V_IN – V_OUT= 40V
V_IN – V_OUT= 40V
V_IN – V_OUT 10V
V_IN – V_OUT 15V
V_IN – V_OUT= 40V
V_IN – V_OUT 15V
V_IN – V_OUT= 40V
100
5
5
5
3
0.5 1.5
0.15 0.5
1.5 3.2
0.24
1
20KRAD(Si)
MIN MAX
100
5
5
5
3
0.5 1.5
0.15 0.5
1.5 3.2
0.24
1
50KRAD(Si) 100KRAD(Si)
MIN MAX MIN MAX
100
100
5
5
5
5
5
5
3
3
0.5
1.5 0.5
1.5
0.15 0.5 0.15 0.5
1.5
3.2 1.5
3.2
0.24
1 0.24
1
200KRAD(Si)
MIN MAX UNITS
100
µA
5
µA
5
µA
5
mA
3
mA
0.5 1.5
A
0.15 0.5
A
1.5 3.2
A
0.24
1
A
Note 1: Unless otherwise specified, these specifications apply for
V_IN – V_OUT= 5V; and I_OUT = 0.1A for the H package (TO-39) and
I_OUT = 0.5A for the K package (TO-3) package. Although power dissipation
is internally limited, these specifications are applicable for power
dissipations of 2W for the TO-39 and 20W for the TO-3. I_MAX is 0.2A for
the TO-39 and 1.5A for the TO-3 package.
Note 2: Regulation is measured at a constant junction temperature using
pulse testing with a low duty cycle. Changes in output voltage due to
heating effects are covered under the specification for thermal regulation.
Note 3: Guaranteed by design, characterization or correlation to other
tested parameters.
Note 4: T_J = 25°C unless otherwise noted.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group C and D End Point Electrical Parameters
(Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3
1,2,3
1
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup
1, after burn-in divided by the total number of devices submitted for burn-
in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
TOTAL DOSE BIAS CIRCUIT
2k
1
ADJ
RH137
2
OUTPUT
243Ω
V_IN CASE
–15V
RH137 TDBC
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
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