RH118 Datasheet, PDF (3/4 Pages) Linear Technology – Precision, High Speed Operational Amplifier

RH118
ELECTRICAL CHARACTERISTICS (Continued)
Note 1: The inputs are shunted with back-to-back Zeners for overvoltage
protection. Excessive current will flow if a differential voltage greater than
5V is applied to the inputs.
Note 2: For supply voltages less than ± 15V, the maximum input voltage is
equal to the supply voltage.
Note 3: These specifications apply for ± 5V V _S ± 20V. The power
supplies must be bypassed with a 0.1µF or greater disc capacitor within
four inches of the device.
Note 4: Guaranteed by design, characterization or correlation to other
tested parameters.
Note 5: Slew rate is 100% tested at wafer probe testing. It is QA sample
tested in finished package form.
Note 6: T_A = 25°C, V_S = ± 20V, V_CM = 0V, unless otherwise specified.
Supply bypassed per Note 3.
TOTAL DOSE BIAS CIRCUIT
10k
15V
2_{– 7}
8V ^{10k 3} +
4
–15V
6
0.1µF
0.1µF
RH118 TDBC
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group C and D End Point Electrical Parameters
(Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures (including Delta
parameters) of group A, subgroup 1, after burn-in divided by the total
number of devices submitted for burn-in in that lot shall be used to
determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
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