RH117 Datasheet, PDF (3/4 Pages) Linear Technology – Positive Adjustable Regulator

RH117
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 5)
SYMBOL PARAMETER
I_ADJ
I _ADJ
Adjust Pin Current
Adjust Pin Current
Change
I_MIN
Minimum Load
Current
Current Limit
CONDITIONS
10mA I _OUT I _MAX
2.5V (V _IN – V_OUT ) 40V,
I_OUT = 10mA
(V_IN – V_OUT ) = 40V
(V_IN – V_OUT ) 15V
(V_IN – V_OUT ) = 40V
H Package
K Package
H Package
K Package
NOTES
10KRAD(Si)
MIN MAX
100
5
5
20KRAD(Si) 50KRAD(Si)
MIN MAX MIN MAX
100
100
5
5
5
5
100KRAD(Si)
MIN MAX
100
5
5
UNITS
µA
µA
µA
5
5
5
5 mA
0.5
0.5
0.5
0.5
A
1.5
1.5
1.5
1.5
A
0.15
0.15
0.15
0.15
A
0.30
0.30
0.30
0.30
A
Note 1: Unless otherwise specified, these specifications apply for
V_IN – V_OUT = 5V; and I_OUT = 0.1A for the H package (TO-39) and
I_OUT = 0.5A for the K package (TO-3) package. Although power dissipation
is internally limited, these specifications are applicable for power
dissipations of 2W for the TO-39 and 20W for the TO-3. I_MAX is 0.5A for
the TO-39 and 1.5A for the TO-3.
Note 2: Regulation is measured at a constant junction temperature using
pulse testing with a low duty cycle. Changes in output voltage due to
heating effects are covered under the specification for thermal regulation.
Note 3: Guaranteed by design, characterization or correlation to other
tested parameters.
Note 4: T_J = 25°C unless otherwise noted.
TOTAL DOSE BIAS CIRCUIT
15V
–15V
RH117
V_IN
OUTPUT
ADJ
0.1µF
2k
61.9Ω
RH117 TA01
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group C and D End Point Electrical Parameters
(Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3
1,2,3
1
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup
1, after burn-in divided by the total number of devices submitted for burn-
in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
3