RH111_15 Datasheet, PDF (3/4 Pages) Linear Technology – Voltage Comparator

RH111
Note 1: Applicable for ±15V supplies. The positive input voltage limit is
30V above the negative supply. The negative input voltage limit is the
negative supply.
Note 2: T_JMAX = 150°C
Note 3: Offset voltage, offset current and bias current specifications apply
for any supply voltage from a single 5V up to ±15V supplies.
Note 4: Offset voltage and offset currents shown are the maximum values
required to drive the output within a volt of either supply with a 1mA load.
These parameters define an error band and take into account the worst-
case effects of voltage gain and input impedance.
Note 5: Response time is specified for a 100mV input step with 5mV
overdrive with the collector output terminated with a 500Ω pull-up resistor
tied to 5V.
Note 6: Do not short the Strobe pin to ground. It should be current driven
at 3mA to 5mA for the shortest strobe time. Currents as low as 500μA will
strobe the RH111 if speed is not important. External leakage on the Strobe
pin in excess of 0.2μA when the strobe is “off ” can cause offset voltage
shifts.
Note 7: R_L = 1kΩ, – 10V ≤ V_OUT ≤ 14.5V
Note 8: V_GND = 0V.
Note 9: V_S = ±15V, V_CM = 0V, V_GND = V^–, T_A = 25°C, unless otherwise
noted.
TOTAL DOSE BIAS CIRCUIT
12V
5.1k
2₊
3_–
12Ω
5.1k
8
7
1
4
12Ω
–12V
RH111 TA01
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D End Point Electrical Parameters
(Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4
1,2,3,4
1,2,3
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup
1, after burn-in divided by the total number of devices submitted for burn-
in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
3