RH1085 Datasheet, PDF (3/4 Pages) Linear Technology – 3A Low Dropout Positive Adjustable Regulator

RH1085
TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) T_A = 25°C unless otherwise noted.
PARAMETER
CONDITIONS
Load Regulation (Notes 1, 2, 5) (V_IN – V_OUT) = 3V
10mA ≤ I_OUT ≤ I_{FULL LOAD}
Dropout Voltage (Note 3)
ΔV_REF = 1%, I_OUT = 3A
Current Limit
(V_IN – V_OUT ) = 5V
(V_IN – V_OUT ) = 25V
Minimum Load Current
(V_IN – V_OUT ) = 25V
Adjust Pin Current
10KRAD(Si)
MIN MAX
0.3
20KRAD(Si)
MIN MAX
0.3
50KRAD(Si)
MIN
MAX
0.3
100KRAD(Si)
MIN MAX
0.3
200KRAD(Si)
MIN MAX UNITS
0.3
%
1.5
1.5
1.55
1.6
1.65
V
3.2
3.17
3.15
3.10
3.0
A
0.2
0.20
0.20
0.20
0.2
A
10
10
10
10
10 mA
120
120
120
120
120 μA
Adjust Pin Current Change
(Note 5)
10mA ≤ I_OUT ≤ I_{FULL LOAD}
1.5V ≤ (V_IN – V_OUT) ≤ 15V
5
5
5
5
5
μA
Note 1: See thermal regulation specifications for changes in output voltage
due to heating effects. Line and load regulation are measured at a constant
junction temperature by low duty cycle pulse testing.
Note 2: Line and load regulation are guaranteed up to the maximum power
dissipation of 30W for RH1085. Power dissipation is determined by the
input/output differential voltage and the output current. Guaranteed
maximum power dissipation will not be available over the full input/output
voltage range.
Note 3: Dropout voltage is specified over the full output current range of
the device. Test points and limits are shown on the Dropout Voltage curve
in the LT^®1085 data sheet.
Note 4: Guaranteed by design, characterization, or correlation to other
tested parameters.
Note 5: For compliance with 883 revision C current density specifications,
the RH1085 is rated to 2A.
TABLE 2: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group C and D End Point Electrical Parameters
(Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown in accordance with method 5004 of MIL-STD-883
Class B. The verified failures of group A, subgroup 1, after burn-in divided
by the total number of devices submitted for burn-in in that lot shall be
used to determine the percent defective for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
TYPICAL PERFORMANCE CHARACTERISTICS
Reference Voltage
1.26
10mA ≤ Δ ≤ I_OUT ≤ I_{FULL LOAD}
1.7V ≤ (V_IN – V_OUT) ≤ 15V
1.25
1.24
1.23
1.22
1
10
100
1000
TOTAL DOSE – KRADS (Si)
RH1085 G01
Ripple Rejection
105
(V_IN – V_OUT) = 3V
100 I_OUT = I_{FULL LOAD}
95
90
85
80
75
70
65
1
10
100
1000
TOTAL DOSE – KRADS (Si)
RH1085 G02
Current Limit
0.46
(V_IN – V_OUT) = 25V
0.45
0.44
0.43
0.42
1
10
100
1000
TOTAL DOSE – KRADS (Si)
RH1085 G03
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
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