RH1021-7_15 Datasheet, PDF (3/4 Pages) Linear Technology – Precision 7V Reference

RH1021-7
TABLE 1A: ELECTRICAL CHARACTERISTICS
Note 1: Output voltage is measured immediately after turn-on. Changes
due to chip warm-up are typically less than 0.005%.
Note 2: Temperature coefficient is measured by dividing the change in
output voltage over the temperature range by the change in temperature.
Separate tests are done for hot and cold; T_MIN to 25°C and 25°C to T_MAX.
Incremental slope is also measured at 25°C.
Note 3: Line and load regulation are measured on a pulse basis. Output
changes due to die temperature change must be taken into account
separately. Package thermal resistance is 150°C/W for the TO-5 (H)
package.
Note 4: Shunt mode regulation is measured with the input open. With the
input connected, shunt mode current can be reduced to 0mA. Load
regulation will remain the same.
Note 5: RMS noise is measured with a 2-pole highpass filter at 10Hz and a
2-pole lowpass filter at 1kHz. The resulting output is full wave rectified and
then integrated for a fixed period, making the final reading an average as
opposed to RMS. Correction factors are used to convert from average to
RMS and to correct for the nonideal bandpass of the filters. Peak-to-peak
noise is measured with a single highpass filter at 0.1Hz and a 2-pole
lowpass filter at 10Hz. The unit is enclosed in a still-air environment to
eliminate thermocouple effects on the leads. Test time is 10 seconds.
Note 6: Consult factory for units with long term stability data.
Note 7: V_IN = 12V, I_OUT = 0, T_A = 25°C, unless otherwise noted.
Note 8: I_OUT(MAX) (Sourcing) is 5mA for exposures greater than
100Krad (Si).
Note 9: V_IN = 12V, I_OUT = 0, unless otherwise noted.
Note 10: Absolute Maximum Ratings are those values beyond which the
life of a device may be impaired.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S, and
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4
1,2,3,4
1,2,3
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
TOTAL DOSE BIAS CIRCUIT
15V
V_IN
GND
–15V
0.1µF
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-
tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
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