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RH1021-10_15 Datasheet, PDF (3/4 Pages) Linear Technology – Precision 10V Reference | |||
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RH1021-10
TABLE 1A: ELECTRICAL CHARACTERISTICS
Note 1: Output voltage is measured immediately after turn-on. Changes
due to chip warm-up are typically less than 0.005%.
Note 2: Temperature coefï¬cient is measured by dividing the change
inoutput voltage over the temperature range by the change in temperature.
Separate tests are done for hot and cold; TMIN to 25°C and 25°C to TMAX.
Incremental slope is also measured at 25°C.
Note 3: Line and load regulation are measured on a pulse basis. Output
changes due to die temperature change must be taken into account
separately. Package thermal resistance is 150°C/W for the TO-5 (H)
package and 170°C/W for the 10-lead ï¬atpack (W) package.
Note 4: Shunt mode regulation is measured with the input open. With
the input connected, shunt mode current can be reduced to 0mA. Load
regulation will remain the same.
Note 5: RMS noise is measured with a 2-pole highpass ï¬lter at 10Hz and
a 2-pole lowpass ï¬lter at 1kHz. The resulting output is full wave rectiï¬ed
and then integrated for a ï¬xed period, making the ï¬nal reading an average
as opposed to RMS. Correction factors are used to convert from average
to RMS and to correct for the nonideal bandpass of the ï¬lters. Peak-to-
peak noise is measured with a single highpass ï¬lter at 0.1Hz and a 2-pole
lowpass ï¬lter at 10Hz. The unit is enclosed in a still-air environment to
eliminate thermocouple effects on the leads. Test time is 10 seconds.
Note 6: Consult factory for units with long term stability data.
Note 7: VIN = 15V, IOUT = 0, TA = 25°C, unless otherwise noted.
Note 8: IOUT(MAX) (Sourcing) is 5mA for exposures greater than
100Krad (Si).
Note 9: VIN = 15V, IOUT = 0, unless otherwise noted.
Note 10: Absolute Maximum Ratings are those values beyond which the
life of a device may be impaired.
TABLE 2: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S and
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
*PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*, 2, 3, 4
1, 2, 3, 4
1, 2, 3
PDA Test Notes
The PDA is speciï¬ed as 5% based on failures from group A, subgroup 1,
tests after cooldown as the ï¬nal electrical test in accordance with method
5004 of MIL-STD-883. The veriï¬ed failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
TOTAL DOSE BIAS CIRCUIT
15V
VIN
GND
â15V
0.1μF
Information furnished by Linear Technology Corporation is believed to be accurate and reliable.
However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa-
tion that the interconnection of its circuits as described herein will not infringe on existing patent rights.
rh102110fe
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