RH1013M_15 Datasheet, PDF (3/6 Pages) Linear Technology – Dual Precision Operational Amplifier

RH1013M
TABLE 1A: ELECTRICAL CHARACTERISTICS (Post-Irradiation)
V_S = ±15V, V_CM = 0V, T_A = 25°C, unless otherwise noted.
SYMBOL PARAMETER
CONDITIONS
10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) 200KRAD(Si)
NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
V_OS
Input Ofset Voltage
450
450
600
750
900 µV
2
600
600
750
900
µV
I_OS
Input Offset Current
10
10
15
20
25
nA
2
10
10
15
20
nA
I_B
Input Bias Current
60
75
100
175
250 nA
2
80
100
125
200
nA
Input Voltage Range
1 13.5
13.5
13.5
13.5
13.5
V
1 –15.0
– 15.0
– 15.0
–15.0
– 15.0
V
2 3.5
3.5
3.5
3.5
V
2
0
0
0
0
V
CMRR Common-Mode Rejection V_CM = 13V, – 15V
Ratio
97
97
94
90
86
dB
PSRR Power Supply Rejection V_S = ±10V to ±18V
Ratio
100
98
94
86
80
dB
A_VOL Large-Signal Voltage Gain R_L ≥ 10k, V_O = ±10V
V_OUT Maximum Output Voltage R_L ≥ 10k
Swing
Output Low, No Load
500
±12.5
2
200
±12.5
25
100
±12.5
30
50
±12.5
40
25
±12.5
50
V/mV
V
mV
Output Low, 600Ω to GND 2
10
10
10
10
mV
Output Low, I_SINK = 1mA
2
0.6
0.8
1.0
1.6
V
Output High, No Load
2 4.0
4.0
4.0
4.0
V
Output High, 600Ω to GND 2 3.4
3.2
3.0
2.8
V
SR
Slew Rate
I_S
Supply Current
R_L ≥ 10k
Per Amplifier
0.13
0.12
0.11
0.55
0.55
2
0.50
0.50
0.07
0.55
0.50
0.01
0.55
0.50
V/µs
0.55 mA
mA
Note 1: Guaranteed by design, characterization, or correlation to other
tested parameters..
Note 2: Specification applies for V_S+ = 5V, V_S– = 0V, V_CM = 0V,
V_OUT = 1.4V.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S, and
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1,2,3
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after
burn-in divided by the total number of devices submitted for burn-in in
that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
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