RH07 Datasheet, PDF (3/4 Pages) Linear Technology – Operational Amplifier

RH07
TABLE 1A: ELECTRICAL CHARACTERISTICS ^{(Post-Irradiation) (Note 6)}
SYMBOL PARAMETER
CONDITIONS
V_OS
Input Offset Voltage
I_OS
Input Offset Current
I_B
Input Bias Current
Input Voltage Range
CMRR Common-Mode
Rejection Ratio
V_CM = ±13V
PSRR Power Supply
Rejection Ratio
V_S = ±3V to ±18V
A_VOL Large-Signal Voltage Gain R_L ≥ 2k, V_O = ±10V
V_OUT Maximum Output
Voltage Swing
R_L ≥ 10k
SR
Slew Rate
P_D
Power Dissipation
R_L ≥ 2k
10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) 200KRAD(Si)
NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX
1
90
150
200
250
300
2.8
4
8
12
20
±3
± 10
±25
±50
±100
3 ±13.5
±13.5
±13.5
±13.5
±13.5
110
110
105
100
95
UNITS
µV
nA
nA
V
dB
100
100
100
95
90
dB
200
±12.5
200
±12.5
180
±12.5
150
±12.5
120
±12.5
V/mV
V
0.1
0.1
0.1
0.075
0.05
V/µs
120
120
120
120
120
mW
Note 1: Offset voltage is measured with high speed test equipment
approximately 0.5 seconds after power is applied.
Note 2: Long-term input offset voltage stability refers to the averaged
trend line of V_OS vs. time over extended periods after the first 30 days of
operation. Excluding the initial hour of operation, changes in V_OS during
the first 30 days are typically 2.5µV.
Note 3: Parameter is guaranteed by design, characterization, or correlation
to other tested parameters.
Note 4: 10Hz noise voltage density is sample tested on every lot to an
LTPD of 15. Devices 100% tested at 10Hz are available on request.
Note 5: V_S = ±15V, V_CM = 0V, unless otherwise noted.
Note 6: T_A = 25°C, V_S = ±15V, V_CM = 0V, unless otherwise noted.
TABLE 2: ELECTRICAL TEST REQUIRE E TS
MIL-STD-883 TEST REQUIREMENTS
Final Electrical Test Requirements (Method 5004)
Group A Test Requirements (Method 5005)
Group B and D for Class S, and
Group C and D for Class B
End Point Electrical Parameters (Method 5005)
* PDA Applies to subgroup 1. See PDA Test Notes.
SUBGROUP
1*,2,3,4,5,6
1,2,3,4,5,6
1
PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1,
tests after cooldown as the final electrical test in accordance with method
5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup
1, after burn-in divided by the total number of devices submitted for burn-
in in that lot shall be used to determine the percent for the lot.
Linear Technology Corporation reserves the right to test to tighter limits
than those given.
U
TOTAL DOSE BIAS CURRE T
10k
15V
–
10k
8V
+
–15V
RH07 F01
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