RH3080MK Datasheet, PDF (2/2 Pages) Linear Technology – Adjustable 0.9A Single Resistor Low Dropout Regulator

DICE/DWF SPECIFICATION
RH3080MK
DICE/DWF ELECTRICAL TEST LIMITS T_A = 25°C. All voltages are relative to OUT.
PARAMETER
CONDITIONS
MIN
SET Pin Current (Note 6)
Output Offset Voltage (V_OUT – V_SET)
Load Regulation, I_SET
Load Regulation, V_OS
Line Regulation, I_SET
Line Regulation, V_OS
Minimum Load Current (Note 3)
V_CONTROL Dropout Voltage (Note 4)
V_IN Dropout Voltage (Note 4)
V_CONTROL Pin Current (Note 5)
V_IN = 1V, V_CONTROL = 2V, I_LOAD = 1mA
V_IN = 1V, V_CONTROL = 2V, I_LOAD = 1mA
I_LOAD = 1mA to 100mA
I_LOAD = 1mA to 100mA
V_IN = 1V to 26V, V_CONTROL = 2V to 26V, I_LOAD = 1mA
V_IN = 1V to 26V, V_CONTROL = 2V to 26V, I_LOAD = 1mA
V_IN = 10V, V_CONTROL = 10V, V_OUT = 0.1V
V_IN = 26V, V_CONTROL = 26V, V_OUT = 0.1V
V_IN = 1V, I_LOAD = 0.1A
V_CONTROL = 2V, I_LOAD = 0.1A
V_IN = 1V, V_CONTROL = 2V, I_LOAD = 0.1A
9.9
–5
–15
–1.0
–0.45
–0.05
MAX UNITS
10.1
μA
5
mV
15
nA
1.0
mV
0.45
nA/V
0.05
mV/V
0.4
mA
0.9
mA
1.4
V
0.17
V
5.3
mA
Note 1: Dice are probe tested at 25°C to the limits shown except for high
current tests. Dice are tested under low current conditions which assure
full load current specifications when assembled in packaging systems
approved by Linear Technology.
Note 2: Unless otherwise specified, all voltages are with respect to V_OUT.
The RH3080MKDICE is tested at die sort under pulse load conditions such
that T_A ≅ T_J.
Note 3: Minimum load current is equivalent to the quiescent current of
the part. Since all quiescent and drive current is delivered to the output
of the part, the minimum load current is the minimum current required to
maintain regulation.
Note 4: Dropout results from either of minimum control voltage,
V_CONTROL, or minimum input voltage, V_IN, both specified with respect
to V_OUT. These specifications represent the minimum input-to-output
differential voltage required to maintain regulation.
Note 5: The V_CONTROL pin current is the drive current required for the
output transistor. This current tracks output current with roughly a 1:60
ratio. The minimum value is equal to the quiescent current of the device.
Note 6: SET pin is clamped to the output with diodes. These diodes only
carry current under transient overloads.
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
2
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
[phone] ^● FAX: [phone] ^● www.linear.com
I.D.No. 66-13-3080 LT 0510 • PRINTED IN USA
© LINEAR TECHNOLOGY CORPORATION 2010