RH1959MILDICE_15 Datasheet, PDF (2/2 Pages) Linear Technology – 4.5A, 500KHz Step-Down Switching Regulator

DICE/DWF SPECIFICATION
RH1959MILDICE
DICE/DWF ELECTRICAL TEST LIMITS For non-specified test conditions, T_A = 25°C, T_J = 25°C, V_IN = 5V,
V_C = 1.5V, Boost = V_IN + 5V, switch open. (Note 2)
PARAMETER
CONDITIONS
MIN
MAX UNITS
Feedback Voltage (Adjustable)
All Conditions
1.19
1.23
V
Reference Voltage Line Regulation
Feedback Input Bias Current
4.3V ≤ V_IN ≤15V
–0.03
–0.5
0.03
%/V
0.5
µA
Error Amplifier Voltage Gain (Note 3)
200
Error Amplifier Transconductance (Note 9)
DI (VC) = ±10mA
1500
2700 mMho
Error Amplifier Source Current
Error Amplifier Sink Current V_FB = 1.35V
Switch Current Limit (Note 9)
Switch On Resistance (Notes 8, 9)
Maximum Switch Duty Cycle V_FB = 1.05V
Switch Frequency
V_FB = 1.05V
140
V_FB = 1.35V
140
VC Open, V_FB = 1.05V, DC ≤ 50%
4.5
I_SW = 4.5A
V_FB = 1.05V
90
VC Set to Give 50% Duty Cycle
460
320
mA
320
mA
8.5
A
0.1
Ω
%
540
kHz
Switch Frequency Line Regulation
Frequency Shifting Threshold on FB Pin
4.3V ≤ V_IN ≤ 15V
Df = 10kHz
–0.15
0.5
0.15
%/V
1
V
Minimum Input Voltage (Note 4)
4.3
V
Minimum Boost Voltage (Notes 5, 9)
Boost Current (Notes 6, 9)
Input Supply Current (Note 7)
I_SW ≤ 4.5A
I_SW = 1A
I_SW = 4.5A
3
V
35
mA
140
mA
5.4
mA
Shutdown Supply Current
Lockout Threshold
Shutdown Thresholds
V_SHDN = 0V, V_SW = 0V, VC Open
VC Open, V_FB = 1.05V, DC ≤ 50%
2.3
VC Open Device Shutting Down
0.13
Device Starting Up
0.25
50
µA
2.46
V
0.6
V
0.7
V
Synchronization Threshold
2.2
V
Synchronizing Range
580
1000
kHz
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: Dice are probe tested at 25°C to the limits shown except for high
current tests. Dice are tested under low current conditions which assure
full load current specifications when assembled in packaging systems
approved by Linear Technology.
Note 3: Gain is measured with a VC swing equal to 200mV above the
switching threshold level to 200mV below the upper clamp level.
Note 4: Minimum input voltage is not measured directly, but is guaranteed
by other tests. It is defined as the voltage where internal bias lines are still
regulated so that the reference voltage and oscillator frequency remain
constant. Actual minimum input voltage to maintain a regulated output will
depend on output voltage and load current.
Note 5: This is the minimum voltage across the boost capacitor needed to
guarantee full saturation of the internal power switch.
Note 6: Boost current is the current flowing into the boost pin with the pin
held 5V above input voltage. It flows only during switch on time.
Note 7: Input supply current is the bias current drawn by the input pin
with switching disabled.
Note 8: Switch on resistance is calculated by dividing V_IN to V_SW voltage
by the forced current (4.5A).
Note 9: This parameter is not measured directly, but is guaranteed by
design.
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
I.D.No. 66-13-3415
2
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
[phone] ^● FAX: [phone] ^● www.linear.com
LT 0814 • PRINTED IN USA
 LINEAR TECHNOLOGY CORPORATION 2014