RH1573K Datasheet, PDF (2/2 Pages) Linear Technology – Low Dropout PNP Regulator Driver

DICE/DWF SPECIFICATION
RH1573K
DICE/DWF ELECTRICAL TEST LIMITS T_A = 25°C.
PARAMETER
CONDITIONS
MIN
MAX
SHDN Pin Threshold Voltage
1
1.5
SHDN Pin Current
LATCH Pin Latch-Off Threshold Voltage
V_SHDN = 5V
300
1.1
1.8
LATCH Pin Charging Current
4
10
LATCH Pin Latching Current
0.85
V_IN to V_OUT Differential Threshold for Latch
Disable
Input Quiescent Current
Minimum Input Voltage for Bias Operation
V_IN = 7V
0.55
0.8
2.8
2.4
Note 1: For circuit operation and application information refer to LT1573
data sheet.
Note 2: For post radiation performance contact factory.
UNITS
V
μA
V
μA
mA
V
mA
V
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
I.D.No. 66-13-rh1573
2
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
[phone] ^● FAX: [phone] ^● www.linear.com
LT 0808 • PRINTED IN USA
© LINEAR TECHNOLOGY CORPORATION 2008