RH1028M_15 Datasheet, PDF (2/2 Pages) Linear Technology – Ultralow Noise Precision High Speed Op Amps

DICE/DWF SPECIFICATION
RH1028M/RH1128M
DICE/DWF ELECTRICAL TEST LIMITS V_S = ±15V, T_A = 25°C, V_CM = 0V, unless otherwise noted.
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
SR
Slew Rate
I_S
Supply Current
A_VCL = –1 (RH1028)
A_VCL = –1 (RH1128)
11
4.5
10.5
Note 1: Input offset voltage measurements are performed by automatic
test equipment approximately 0.5 seconds after application of power.
UNITS
V/μs
V/μs
mA
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
I.D.No. 66-13-1028
2
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
[phone] ^● FAX: [phone] ^● www.linear.com
LT 0908 • PRINTED IN USA
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