LT1007_09 Datasheet, PDF (2/2 Pages) Linear Technology – Low Noise, High Speed Precision Op Amp

DICE/DWF SPECIFICATION
LT1007
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information
on dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
1007dice/dwffa
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Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
[phone] ^● FAX: [phone] ^● www.linear.com
I.D.No. 66-13-1007 • LT 1009 REV A • PRINTED IN USA
© LINEAR TECHNOLOGY CORPORATION 2009