E2681A Datasheet, PDF (9/15 Pages) Keysight Technologies – EZJIT Plus Jitter Analysis Software

09 | Keysight | EZJIT Plus Jitter Analysis Software for Infiniium Oscilloscopes – Data Sheet
Real-time trend, histogram, and spectrum displays
Measurement data can be viewed as a trend display (Figure 13), showing a time plot
of the measurement timecorrelated with the signal waveform data. This makes it easy
to understand relationships between jitter and signal conditions, such as intersymbol
interference (ISI). EZJIT provides up to 17 measurement trends to be analyzed at once.
The histogram display (Figure 14) plots the relative occurrence of values for the
measured parameter. The histogram provides insight into the statistical nature of the jitter.
For example, the histogram shown in Figure 14 appears as two gaussian distributions.
The peak-to-peak jitter between the gaussians indicates significant deterministic jitter in
the signal, while the gaussians show the spread of random jitter.
The spectrum display (Figure 15) shows the spectral content of the jitter. The spectrum
display can be useful for identifying sources of jitter by their frequency components. For
example, if you suspect a switching power supply with a switching frequency of 33‑KHz
is injecting jitter, you can test your theory by examining the jitter spectrum for a peak at
33‑KHz.
Figure 13. A trend display, showing a time plot of the measurement
timecorrelated with the signal waveform data, makes it easy to understand
relationships between jitter and signal conditions.
Figure 14. A histogram display plots the relative occurrence of values for the
measured parameter, providing insight into the statistical nature of the jitter.
Figure 15. A spectrum display shows the spectral content of the jitter, useful for
identifying sources of jitter by their frequency components.