W9068A Datasheet, PDF (7/16 Pages) Keysight Technologies – Phase Noise X-Series

07 | Keysight | Phase Noise X-Series Measurement Application N9068A & W9068A - Technical Overview
Integrated noise
measurement
Different applications require differ-
ent measures for evaluating phase
noise behaviors. In the digital world,
root-mean-square (rms) phase devia-
tion/jitter (in degrees or radians) and
rms phase jitter (in seconds) are used
more frequently to evaluate the sta-
bility of a high-frequency clock. On
the other hand, residual FM is more
important to amplifier designers and
manufacturers. The X-Series signal
analyzers make these measurements
easy with advanced marker functions
(Figure 4).
The band marker functions
enable you to:
–– Characterize phase noise related
behaviors from different angles
for various applications
–– Adjust bandwidth for integrating
noise power (in dB/bandwidth
Hz)¹ or averaging noise power
density (in dB/Hz)¹ by using
advanced band markers on the
log plot
–– Calculate rms phase deviation (or
residual PM) in degrees or radi-
ans
–– Calculate rms jitter in seconds
–– Calculate the residual FM in Hz
–– View numeric marker readings for
calculated results
–– View readings of multiple mark-
ers
Multiple spurious
peak search
The marker menu supports the
spurious peak search function1, peak,
next peak, right peak, and left peak.
The “raw” trace (yellow) indicates
that spurious signals are automati-
cally detected and separated. The
“smoothed” trace (light blue) remains
after the spurious products are re-
moved from the “raw” trace.
Advanced scaled
delta markers
The delta marker menu enables you
to select various scales of:
–– Absolute/normal (x Hz)
–– Octave slope (2x Hz)¹
–– Decade slope (10x Hz)¹
1.  Requires Option AFP or ATP for previ-
ously purchased equipment.