W6141A Datasheet, PDF (6/11 Pages) Keysight Technologies – X-Series Measurement Application

Go faster with time
domain scanning
The EMI measurement application
offers three types of frequency
scanning: swept, stepped, and
time domain.¹ Time domain scan
decreases total test time by reducing
overall prescan collection times when
longer measurement dwell times are
required.
Dwell for each
resolution bandwidth
Receiver resolution bandwidth
Dwell for each FFT bandwidth
(multiple resolution bandwidth)
FFT acquisition bandwidth
Time domain scan speeds
measurements by using high-overlap
fast Fourier transforms (FFTs) to
collect emissions data simultaneously
over an acquisition bandwidth that
is multiple resolution bandwidths
wide. This is in contrast to frequency-
domain measurements, which
collect data in individual resolution
bandwidths.
Frequency
Swept or stepped frequency domain scan
Figure 7. Comparison of resolution and FFT acquisition bandwidths
Time domain scan
Frequency
With time domain testing, you can
collect suspect lists rapidly, greatly
improving overall test time and
throughput.
Automate click
measurements
Use the built-in disturbance analyzer
to easily make discontinuous
disturbance, or click, precompliance
measurements as speciied in CISPR
14-1. Simplify and automate data
collection, analysis, and report
generation for these commonly tested
emissions for more eficient testing.
Figure 8. Simplify and automate data collection, analysis, and report generation for click measurements
1. Requires Options DP2 or B40. Not available for CXA.
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