N5432C Datasheet, PDF (5/12 Pages) Keysight Technologies – FlexRay Measurements (Option FLX)

Making FlexRay Eye-diagram Mask Tests
With Keysight’s mask testing capability,
you can also perform automatic pass/fail
eye-diagram mask tests based on published
FlexRay physical layer standards.
Figure 3 shows a mask test at the TP1 test
plane. The reference for this particular test is
based on triggering on alternating rising and
falling edges at the output of a bus driver. In
this example more than 3,500,000 bits were
tested.
Figure 4 shows an eye-diagram mask test on
a relatively noisy FlexRay signal at the TP4
receiver test plane. This eye-diagram test
was generated by capturing and overlaying
bits from all frames in a multi-node system.
Since this test is performed at or near the in-
put of a FlexRay receiver, this test is based on
triggering on repetitive byte start sequence
(BSS) events, which are the re-synchronizing
events for a receiver’s sampling.
Figure 3. FlexRay TP1 mask test at the output of a bus driver.
FlexRay mask test criteria
and failure analysis
Keysight’s InfiniiVision Series oscilloscope
mask testing is the only hardware-based mask
testing in the oscilloscopes industry. This
produces the industry’s fastest mask testing
with test rates up to 100,000 waveforms
tested per second. With test rates this fast
the scope can quickly uncover very infrequent
anomalies and provide detailed pass/fail
statistics, including a Sigma quality report.
In addition, you have the ability to customize
your testing based on a variety of test criteria,
including:
.
– Test continuously
– Test until 1st error detected
– Test until a user-specified number
of tests has been satisfied
– Test until a user-specified test
time has been satisfied
– Test until a user-specified
potential Six Sigma quality has
been satisfied
Figure 4. FlexRay TP4 mask test at the input of a FlexRay receiver.
Figure 5 shows an example of a “stop-on-
error” TP4 eye-diagram mask test based on
the capture and overlay of bits from just frame
ID:1. The first mask violation, which occurred
after testing approximately 5000 bits, reveals
a runt pulse with time shift.
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