M9080B Datasheet, PDF (4/16 Pages) Keysight Technologies – M9080B & M9082B LTE

RF Transmitter Tests
With the LTE/LTE-Advanced FDD and TDD measurement
applications, you can perform RF transmitter measure-
ments on eNB and UE devices in time, frequency, and
modulation domains. Measurement setups are simpli-
fied with automatic detection of downlink channels and
signals. For eNB conformance testing, measurement is
simplified by recalling E-TM presets according to 3GPP TS
36.141 specification.
For LTE-Advanced demodulation measurements, such as
EVM and frequency error, the measurement application
uses an automatic sequencing function, instead of a single
wideband capture of the multi-carrier signal, eliminat-
ing the need for the wide analysis bandwidth option on
the signal analyzer and thereby reducing the overall test
equipment cost. The measured results of up to 5 CCs for
LTE-Advanced can be viewed side-by-side and represent-
ed in multiple domains such as resource block, sub-car-
rier, slot, or symbol. Graphical displays with color coding
and marker coupling allows you to search for problems
faster and troubleshoot the found problems quicker. For
manufacturing, “conformance EVM” measurement pro-
vides significant speed improvement over the traditional
EVM measurement.
In addition, the measurement applications allow you to
test beyond physical layer by using the transport layer
decoding functionality. Troubleshoot transport layer prob-
lems and verify the channel encoding is correct by access-
ing data at different points in the receiver chain such as
demapped, deinterleaved, descrambled, deratematched,
and decoded data.
For unwanted emissions, 3GPP Release 11 adds LTE-
Advanced RF conformance requirements for intra-band,
non-contiguous carrier aggregation because the spectrum
in the sub-block gap can be deployed by another service
provider, perhaps using a different technology. These new
RF requirements are cumulative adjacent channel leakage
power (CACLR), to measure the contributions from car-
riers on both sides of the sub-block gap, and cumulative
spectrum emissions mask (SEM) measurement where a
new special limit mask is defined for unwanted emissions
within a sub-block gap calculated as the cumulative sum
of contribution from each sub-block. The LTE-Advanced
embedded measurement application provides limits for
both CACLR and SEM in non-contiguous carrier aggrega-
tion.
Choosing between X-Series embedded applications and 89600 VSA software
X-Series measurement applications provide format-specific, one-button measurements for X-Series analyzers
and modular PXI VSAs. With fast measurement speed, SCPI programmability, pass/fail testing and simplicity of
operation, these applications are ideally suited for design verification and manufacturing. The 89600 VSA is the
industry-leading measurement software for evaluating and troubleshooting signals for R&D and design validation.
Supporting numerous measurement platforms and multiple measurement channels, the 89600 VSA provides flex-
ibility and sophisticated measurements tools essential to find and fix signal problems. Recent enhancements for
the modular PXI VSA platforms (89601B-SSA) provide fast spectrum measurements with benchtop analyzer SCPI
programming compatibility.
www.keysight.com/find/89600_vsa
4