W2500EP Datasheet, PDF (2/6 Pages) Keysight Technologies – Keysight EEsof EDA

Introduction
Figure 1. Eye diagram results from the ADS Transient-Convolution Simulator show excellent
correlation with measurements, enabling rapid “what if” design space exploration.
The Keysight EEsof EDA—the technology and innovation leader in high-speed,
high-frequency electronic design automation—takes SPICE to a new level with
the ADS Transient Convolution Element. This simulator is the industry’s fastest
signal integrity circuit simulator for multigigabit, high-speed data link design.
Multicore processor support and a new, high-capacity sparse matrix solver
achieves a three-fold simulation speed improvement for signal integrity simula-
tions.
Design and verification of chip-to-chip multigigabit/s serial links is the morst
common application for the Transient Convolution Element. At the very high
data rates at which these links operate, signal integrity engineers must take into
account physical phenomena such as impedance mismatch, reflections, elec-
tromagnetic coupling, crosstalk and microwave frequency attenuation due to
the skin effect and dielectric loss tangent. The simulator allows signal integrity
engineers to perform “what-if” design space exploration using a circuit-level
model that can be verified against measured data, and electromagnetic simula-
tion on the post-layout artwork to arrive at an optimum design while avoiding
costly and time consuming prototype iterations.