W2346EP Datasheet, PDF (2/2 Pages) Keysight Technologies – W2301 Circuit Envelope Element

The Circuit Envelope Element capabilities include:
–– Circuit Envelope simulation, for efficient analysis of digitally modulated and
transient RF excitation in circuits and systems.
–– Accurate circuit simulation of error-vector magnitude (EVM), adjacent channel
power ratio (ACPR), adjacent channel leakage ratio (ACLR), and bit-error-rate
(BER) with specification-compliant 2G, 3G, and 4G modulated RF wireless
signals.
–– X-parameter non-linear model simulation under modulated RF excitation.
–– Linearizer design guide, providing popular topologies and simulation templates
for designing power amplifier linearizer circuits.
–– Phase locked loop (PLL) design guide, providing popular topologies and
simulation templates for phase locked loop circuits.
–– RF system design guide, providing system architecture design and analysis
utilities and simulation templates for setting up digitally modulated RF sources
and for verification of wireless specifications.
–– Circuit-system co-simulation when used with the Ptolemy system simulator.
Unlike other envelope simulators, which can only use system behavioral models to
simulate just the envelope of the RF carrier without taking into account impedance
mismatches, Circuit Envelope allows any combination of circuit, system, and
measured X-parameter blocks to be accurately simulated with modulated RF signals
and accounts for signal reflections and frequency mixing throughout the network.
Circuit Envelope takes full advantage of X-parameters, the latest Keysight innovation
that captures full non-linear characteristics from a non-linear vector network
analyzer (NVNA) measurement. It lets you to create accurate non-linear designs,
such as power amplifier linearization and power-added efficiency (PAE) optimization,
under digitally modulated RF excitation with measured X-parameters of off-the-shelf
components. You can’t do this with any other envelope simulator!
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© Keysight Technologies, 2009 - 2014
Published in USA, December 30, 2014
5990-3809EN
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