E6650A-001 Datasheet, PDF (2/8 Pages) Keysight Technologies – Small Cell Test, Reference Solution

02 | Keysight | Small Cell Test, Reference Solution - Solution Brochure
Small Cell Test Challenges
The small cell market is characterized by evolving standards, interworking radio access
technologies and increasing production volumes.
Time-to-market can make the difference between the success and failure of a com-
mercial project. Test development can consume valuable resources and extend project
timelines. The increasing complexity of evolving standards means that test developers
are never standing still, needing to adapt to the latest requirements.
Demand for small cells is increasing, volumes are expanding and devices require more
intensive test: multiple radio-access-technologies, multiple carriers more RF ports to
support MIMO. This drives the need for more testing per device.
Cost of test is under increasing pressure, driving the need for reduced test times and
more test capacity packed into a given space or footprint.
The ability to make consistent measurements in different environments is essential to
an efficient production machine. Failures on the production line need to be replicated,
verified and resolved quickly, often across geographies and time zones.
Drive down your cost of test:
–– Save engineering time spent on
test development and debug
–– Improved throughput and asset
utilization
–– Consistent measurements
from development bench to
manufacturing
Small cell Reference Solution
The Keysight small cell test, reference solution is designed around typical test plans,
including calibration steps and performance test. Comprehensive test automation
examples control both the DUT and the measurement hardware, which means you can
easily run calibration and verification sequences from start to finish with simple pass/fail
outcomes.
Keysight is collaborating with leading chipset vendors to implement their current
measurement plans and aligning on a roadmap to next generation designs. The Keysight
reference solution includes test automation with example test steps that can be built into
fully-automated test sequences. You can also call Keysight’s code from your own choice
of test executive, or use the supplied examples to validate tests you have coded in your
own automation environment.
Whether you are verifying a design or testing for production, additional debug capability
is on hand, so you can focus in on the details. With the aid of the graphical user inter-
face, you can easily understand how your design is performing and quickly get to the
root of any problems. And if you need to reduce your test time there is a timing analyzer
to help you optimize test flow.
With up to 16 RF ports in a single 19” rack instrument, the reference solution can be
scaled to provide superior port density and the ability to connect multiple multi-port
DUTs simultaneously. The multiple RF sources and RF analyzers can independently
create or analyze a signal sequence for the DUT, further improving test efficiency and
throughput.
This solution uses the same measurement software that you find in Keysight’s signal
analyzers and signal generators, so you can be sure of consistency between different
hardware platforms.