PNA-X Datasheet, PDF (14/41 Pages) Keysight Technologies – Microwave Network Analyzers

14 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure
Innovative
Applications
Fast and accurate
noise igure
measurements
(Option 028, 029)
(continued)
PNA-X’s unique source-corrected noise igure solution
– Uses modiied cold-source method, eliminating need for noise source when
measuring DUT
– Corrects for imperfect system source match by using vector correction to remove
mismatch errors plus an ECal module used as an impedance tuner to remove
noise-parameter-induced errors
– Maintains high measurement accuracy in ixtured, on-wafer, or automated-test
environments
– Accurately measures differential devices using vector deembedding of baluns or
hybrids
DUT
Measure differential devices by
deembedding baluns or hybrids.
Frequency
At each test frequency, four or more noise measurements
are made with known, non-50-ohm source impedances.
From these measurements, 50-ohm noise igure is
accurately calculated.
+28 V
J11 J10 J9 J8
Rear panel
J7
J2 J1
+
–
R1
Source 1
OUT 1
OUT 2
Pulse
modulator
A
Source 2
OUT 1
OUT 2
Pulse
modulator
LO
To receivers
Pulse generators
R2
1
2
3
4
Noise receivers
10 MHz to
3 GHz
3 to
26.5 GHz
B
Noise source used
for calibration only
Test port 1
Source 2
Output 1
Source 2
Output 2
Test port 2
Impedance
tuner for
noise figure
measurements
DUT
Block diagram of a two-port N5242A PNA-X with Options 200, 219, 224, and Noise Figure Option 029.
A standard ECal module is used as an impedance tuner to help remove the effects of imperfect system
source match. N5244/45/47A models include a built-in impedance tuner.