JS-1500 Datasheet, PDF (1/4 Pages) Keysight Technologies – In-depth jitter characterization of clock and data devices from 50 kHz to 20 GHz

Agilent JS-1500
Clock/Data Jitter Solution
In-depth jitter characterization of clock
and data devices from 50 kHz to 20 GHz
A fully integrated, turnkey solution
The Agilent JS-1500 is a high-performance characterization
and verification solution for testing electrical timing genera-
tors or timing recovery devices such as VCOs, clock multipliers
(CMUs), PLLs, clock recovery units (CRUs), serializer/deserializ-
ers (SERDES) or instrument-grade signal generators. Wide
frequency coverage supports testing of everything from low-
frequency oscillators for general-purpose electronics to
more highly-integrated digitally-controlled timing circuits for
standard electrical and optical communications system data
rates. Low system intrinsic jitter, automated jitter test sets,
and simplified GUIs ensure high accuracy and repeatability.
The JS-1500 solution is an extension of the Phase Noise
Measurement System with both automated test hardware
and software to enable the following measurements:
• absolute jitter generation
• residual jitter generation
• jitter tolerance (BERT-based)
• jitter tolerance for PLLs (non-BERT based)
• jitter transfer
JS-1500 was created for designers who want to differentiate
their products on performance, time to market, or price. Using
an ultrawideband hardware architecture (500 MHz
to 13 GHz for most measurements), it allows for
characterization of products to SONET/SDH jitter
measurement standards as well as IEC standards governing
the quality of crystal-controlled oscillators while supporting
application of these jitter measurement methods to emerging
comms standards at 1.5 and 3 Gb/s (serial ATA), 5 Gb/s (PCI
Express), 6.25 Gb/s (double-XAUI), and any other data rate
within the 500 MHz to 13 GHz range.
Go beyond compliance testing
The JS-1500 goes beyond compliance testing to a particular
standard or standards to offer ongoing competitive advantage
in two areas:
• Maximum design insight through very low intrinsic jitter,
narrowband jitter spectral information, and spur
identification and separation
• Broad application support for current and future
telecom/datacom standards through continuously-
variable frequency of test