VE0603M300R002 Datasheet, PDF (4/15 Pages) Kemet Corporation – Surface Mount Varistors VE Series High Temperature

SMD Varistors
VE Series – SMD 150°C Low Voltage High Temperature Varistors
Qualifications cont'd
Reliability Parameter
Environmental and
Storage Reliability
Mechanical Reliability
Electrical Transient
Conduction
Test
Climatic Sequence
Thermal Shock
Steady State Damp Heat
Storage Test
Solderability
Resistance to Soldering
Heat
Terminal Strength
Board Flex
Vibration
Mechanical Shock
ISO–7637–1 Pulses
Tested According to
Condition to be Satisfied
after Testing
CECC 42200, Test 4.16 or IEC 1051–1, Test 4.17.
a) Dry heat, 16 hours, UCT, Test Ba, IEC 68–2–2
b) Damp heat, cyclic, the first cycle: 55°C, 93 % RH,
24 hours, Test Db 68–2–4
c) Cold, LCT, 2 hours Test Aa IEC 68–2–1
d) Damp heat cyclic, remaining 5 cycles: 55°C, 93 %
RH, 24 hour/cycle, Test Bd, IEC 68–2–30
|δ_Vn (1 mA)| < 10 %
CECC 42200, Test 4.12, Test Na, IEC 68–2–14,
AEC–Q200 Test 16, 5 cycles UCT/LCT, 30 minutes
|δ_Vn (1 mA)| < 10 %
no visible damage
CECC 42200, Test 4.17, Test Ca, IEC 68–2–3,
AEC–Q200 Test 6, 56 days, 40°C, 93% RH. AEC–Q200
Test7: Bias, Rh, T all at 85.
|δ_Vn (1 mA)| < 10 %
IEC 68–2–2, Test Ba, AEC–Q200 Test 3,
1,000 hours at maximum storage temperature
|δ_Vn (1 mA)| < 5 %
CECC 42200, Test 4.10.1, Test Ta IEC 68–2–20
solder bath and reflow method
Solderable at shipment
and after 2 year of storage,
criteria > 95% must be
covered by solder for reflow
meniscus
CECC 42200, Test 4.10.2, Test Tb, IEC 68–2–20 solder
bath and reflow method
|δ_Vn (1 mA)| < 5 %
JIS–C–6429, App. 1, 18N for 60 seconds – same for
AEC–Q200 Test 22
no visual damage
JIS–C–6429, App. 2, 2 mm minimum
AEC–Q200 test 21 – Board flex: 2 mm flex minimum
|δ_Vn (1 mA)| < 2 %
no visible damage
CECC 42200, Test 4.15, Test Fc, IEC 68–2–6, AEC–
Q200 Test 14.
Frequency range 10 to 55 Hz (AEC: 10 – 2,000 Hz)
Amplitude 0.75 m/s2 or 98 m/s2 (AEC: 5 g's for 20
minutes)
Total duration 6 hours (3x2h) (AEC: 12 cycles each of
3 directions)
Waveshape – half sine
|δ_Vn (1 mA)| < 10 %
no visible damage
CECC 42200, Test 4.14, Test Ea, IEC 68–2–27,
AEC–Q200 Test 13.
Acceleration = 490 m/s2 (AEC: MIL-STD–202–Method
213),
Pulse duration = 11 ms,
Waveshape – half sine; Number of shocks = 3x6
|δ_Vn (1 mA)| < 10 %
no visible damage
AEC–Q200 Test 30: Test pulses 1 to 3.
Also other pulses – freestyle.
|δ_Vn (1 mA)| < 10 %
no visible damage
© KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com
V0003_VE • 10/26/2016 4