JH35320480C Datasheet, PDF (14/24 Pages) Jewel Hill Electronic – SPECIFICATIONS FOR LCD MODULE

JEWEL HILL ELECTRONIC CO.,LTD.
No.
Test Item
Test Conditions
Remark
Storage
1 High Temperature
Operation
80℃, 120Hr
70℃, 120Hr
Note
Note
Storage
2 Low Temperature
Operation
-30℃, 120Hr
-20℃, 120Hr
Note
High Temperature and High
3
Humidity
60℃, 90%RH, 120Hr
-10℃(1Hr)Æ25℃(5min)Æ60℃(1Hr)
Storage
32 Cycles
4 Temperature Cycle
-20℃(1Hr)Æ25℃(5min)Æ60℃(1Hr)
Operation
25 Cycles
5
Peeling Off (Storage)
≧500gf/cm
6
FPC Bending Test
≧6,000 times, 2/sec
Note
Note
Note
Note
50HZ, 30min,
7
Vibration Test(Storage)
Note
Amplitude: 2 cm, X/Y/Z directions
8
Drop Test
60cm/ 3Corner/ 8Face, 1Cycle
Note
Note:
1) The test samples should be applied to only one test item.
2) Sample size for each test item is 5~10pcs.
3) For Damp Proof Test, pure water(Resistance>1MΩ) should be used.
4) In case of malfunction defect caused by ESD damage, if it would be recovered to
normal state after resetting, it would be judged as a good part.
5) EL evaluation should be excepted from reliability test with humidity and temperature:
Some defects such as black spot/blemish can happen by natural chemical reaction
with humidity and fluorescence EL has.
6) After the reliability test, the test samples should be inspected after 2 hours at least.
7) Functional test is OK. Missing segment, shorts, unclear segment, non display,
display abnormally, liquid crystal leak are not allowed.
8) After testing, the current Idd should be within initial value ±20%.
9) No low temperature bubbles ,end seal loose and fall, frame rainbow, ACF bubble
growing are allowable in the appearance test.
11.Inspection Criterion
11.1. Sampling Method
JH35320480C VER: 1.0
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Issue date: 2013/08/12