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IXZH10N50LA Datasheet, PDF (1/9 Pages) IXYS Corporation – RF Power MOSFET
IXZH10N50LA/B
RF Power MOSFET
N-Channel Enhancement Mode Linear 175MHz RF MOSFET
Low Capacitance Z-MOSTM MOSFET Process
Optimized for Linear Operation in Common Source Mode
VDSS
ID25
= 500 V
= 10 A
Symbol
VDSS
VDGR
VGS
VGSM
ID25
IDM
IAR
EAR
dv/dt
Test Conditions
TJ = 25°C to 150°C
TJ = 25°C to 150°C; RGS = 1 MΩ
Continuous
Transient
Tc = 25°C
Tc = 25°C, pulse width limited by TJM
Tc = 25°C
Tc = 25°C
IS ≤ IDM, di/dt ≤ 100A/µs, VDD ≤ VDSS,
Tj ≤ 150°C, RG = 0.2Ω
IS = 0
Maximum Ratings
500 V
500 V
±20 V
±30 V
10 A
60 A
16 A
TBD mJ
5 V/ns
>200 V/ns
150V (operating)
PDC
PDHS
PDAMB
RthJC
RthJHS
(1)
Tc = 25°C, Derate 6.0W/°C above 25°C
Tc = 25°C
250 W
180 W
3W
0.60 C/W
0.85 C/W
VDSS
VGS(th)
IGSS
IDSS
RDS(on)
gfs
TJ
TJM
Tstg
TL
Weight
VGS = 0 V, ID = 4 ma
VDS = VGS, ID = 250µΑ
VGS = ±20 VDC, VDS = 0
VDS = 0.8VDSS
VGS=0
TJ = 25C
TJ =125C
min.
500
3.5
VGS = 20 V, ID = 0.5ID25
Pulse test, t ≤ 300µS, duty cycle d ≤ 2%
VDS = 50 V, ID = 0.5ID25, pulse test
-55
-55
1.6mm(0.063 in) from case for 10 s
typ. max.
4.95
6.5
±100
50
1
1.0
3.8
+175
+175
+ 175
300
4
V
V Features
nA
• IXYS RF Low Capacitance Z-MOSTM
Process
µA
• Very low insertion inductance (<2nH)
mA • No beryllium oxide (BeO) or other
hazardous materials
Ω
Advantages
S
• High Performance RF Z-MOSTM
• Common Source RF Package
°C
A = Gate Source Drain
B = Drain Source Gate
°C
°C
°C
g