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IXTH50N30 Datasheet, PDF (1/4 Pages) IXYS Corporation – Advance Technical Information High Current Power MOSFET
Advance Technical Information
High Current
Power MOSFET
N-Channel Enhancement Mode
IXTH 50N30
IXTT 50N30
VDSS
ID25
RDS(on)
= 300 V
= 50 A
= 65 mΩ
Symbol
VDSS
VDGR
VGS
VGSM
ID25
IDM
IAR
EAR
EAS
dv/dt
PD
TJ
TJM
Tstg
TL
Md
Weight
Test Conditions
TJ = 25°C to 150°C
TJ = 25°C to 150°C; RGS = 1 MΩ
Continuous
Transient
TC = 25°C
TC = 25°C, pulse width limited by TJM
TC = 25°C
TC = 25°C
TC = 25°C
IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS,
TJ ≤ 150°C, RG = 2 Ω
TC = 25°C
1.6 mm (0.062 in.) from case for 10 s
Mounting torque (TO-247)
TO-247
TO-268
Maximum Ratings
300
V
300
V
±20
V
±30
V
50
A
200
A
50
A
50
mJ
1.5
J
5
V/ns
400
W
-55 ... +150
°C
150
°C
-55 ... +150
°C
300
°C
1.13/10 Nm/lb.in.
6
g
5
g
Symbol
Test Conditions
(TJ = 25°C, unless otherwise specified)
VDSS
VGS = 0 V, ID = 250 µA
VGS(th)
VDS = VGS, ID = 250µA
IGSS
VGS = ±20 VDC, VDS = 0
IDSS
VDS = VDSS
VGS = 0 V
TJ = 25°C
TJ = 125°C
RDS(on)
VGS = 10 V, ID = 0.5 ID25
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
Characteristic Values
Min. Typ. Max.
300
V
2.0
4.0 V
±100 nA
25 µA
250 µA
65 mΩ
TO-247 (IXTH)
(TAB)
TO-268 (IXTT)
GS
D (TAB)
G = Gate
S = Source
D = Drain
TAB = Drain
Features
z International standard packages
z Low RDS (on) HDMOSTM process
z Rugged polysilicon gate cell structure
z Unclamped Inductive Switching (UIS)
rated
z Low package inductance
- easy to drive and to protect
Advantages
z Easy to mount
z Space savings
z High power density
© 2003 IXYS All rights reserved
DS99011A(08/03)