IXSK50N60BU1 Datasheet, PDF (1/6 Pages) IXYS Corporation – IGBT with Diode

IGBT with Diode
Short Circuit SOA Capability
IXSK 50N60BU1
IXSX 50N60BU1
V_CES
I_C25
V_CE(sat)
= 600 V
= 75 A
= 2.5 V
PLUS247
(IXSX)
Symbol
Test Conditions
V
CES
V_CGR
V
GES
V_GEM
I_C25
I
C90
I_CM
SSOA
(RBSOA)
T
J
= 25°C to 150°C
T_J = 25°C to 150°C; R_GE = 1 MW
Continuous
Transient
T_C = 25°C, limited by leads
T
C
= 90°C
T_C = 25°C, 1 ms
V=
GE
15
V,
T
VJ
=
125°C,
R
G
=
22
W
Clamped inductive load, L = 30 mH
t
SC
(SCSOA)
P_C
T_J
T_JM
T_stg
M
d
Weight
V=
GE
15
V,
V
CE
=
360
V,
T
J
=
125°C
R_G = 22 W, non repetitive
T_C = 25°C
Mounting torque
Maximum lead temperature for soldering
1.6 mm (0.062 in.) from case for 10 s
Maximum Ratings
600
V
600
V
±20
V
±30
V
75
A
50
A
200
A
I = 100
A
CM
@ 0.8 V_CES
10
ms
300
W
-55 ... +150
°C
150
°C
-55 ... +150
°C
0.9/6 Nm/lb.in.
10
g
300
°C
Symbol
BV_CES
V_GE(th)
I_CES
I_GES
V_CE(sat)
Test Conditions
I_C = 3 mA, V_GE = 0 V
I_C = 4 mA, V_CE = V_GE
V_CE = 0.8 • V_CES
V_GE = 0 V
V_CE = 0 V, V_GE = ±20 V
I_C = I_C90; V_GE = 15 V,
Characteristic Values
(T
J
=
25°C,
unless
otherwise
specified)
min. typ. max.
600
4
T_J = 25°C
T_J = 125°C
V
8V
325 mA
17 mA
±100 nA
2.2 2.5 V
G
CE
TO-264 AA
(IXSK)
C (TAB)
G
CE
G = Gate,
E = Emitter,
C = Collector,
TAB = Collector
Features
• International standard package
JEDEC TO-264 AA, and hole-less
TO-247 package for clip mounting
• Guaranteed Short Circuit SOA
capability
• High frequency IGBT and anti-
parallel FRED in one package
• Latest generation HDMOS^TM process
• Low V_CE(sat)
- for minimum on-state conduction
losses
• MOS Gate turn-on
- drive simplicity
• Fast Recovery Epitaxial Diode (FRED)
- soft recovery with low I_RM
Applications
• AC motor speed control
• DC servo and robot drives
• DC choppers
• Uninterruptible power supplies (UPS)
• Switch-mode and resonant-mode
power supplies
Advantages
• Space savings (two devices in one
package)
• Easy to mount with 1 screw
(isolated mounting screw hole)
• Reduces assembly time and cost
IXYS reserves the right to change limits, test conditions, and dimensions.
© 2000 IXYS All rights reserved
97520A (12/98)
1-6