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IXFR21N100Q_03 Datasheet, PDF (1/4 Pages) IXYS Corporation – HiPerFET Power MOSFETs ISOPLUS247
HiPerFETTM Power MOSFETs
ISOPLUS247TM
IXFR 21N100Q
(Electrically Isolated Back Surface)
N-Channel Enhancement Mode, Low Qg,
High dv/dt, Low trr, HDMOSTM Family
VDSS
ID25
RDS(on)
= 1000 V
= 18 A
= 0.50 Ω
trr ≤ 250 ns
Symbol
VDSS
VDGR
VGS
VGSM
ID25
IDM
IAR
EAR
EAS
dv/dt
PD
TJ
TJM
Tstg
TL
VISOL
Weight
Symbol
VDSS
VGS(th)
IGSS
IDSS
RDS(on)
Test Conditions
TJ = 25°C to 150°C
TJ = 25°C to 150°C; RGS = 1 MΩ
Continuous
Transient
TC = 25°C
TC = 25°C, Note 1
TC = 25°C
TC = 25°C
TC = 25°C
IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS
TJ ≤ 150°C, RG = 2 Ω
TC = 25°C
1.6 mm (0.063 in.) from case for 10 s
50/60 Hz, RMS t = 1 min
Maximum Ratings
1000
1000
±20
±30
18
84
21
60
2.5
10
V
V
V
V
A
A
A
mJ
J
V/ns
350
W
-55 ... +150
°C
150
°C
-55 ... +150
°C
300
°C
2500
V~
5
g
Test Conditions
VGS = 0 V, ID = 1mA
VDS = VGS, ID = 4mA
VGS = ±20 V, VDS = 0
VDS = VDSS
VGS = 0 V
VGS = 10 V, ID = IT
Notes 2, 3
Characteristic Values
(TJ = 25°C, unless otherwise specified)
min. typ. max.
1000
V
3
5V
±100 nA
TJ = 125°C
100 µA
2 mA
0.5 Ω
ISOPLUS 247TM
E153432
G = Gate
S = Source
Isolated backside*
D = Drain
* Patent pending
Features
z Silicon chip on Direct-Copper-Bond
substrate
- High power dissipation
- Isolated mounting surface
- 2500V electrical isolation
z IXYS advanced low Qg process
z Low gate charge and capacitances
- easier to drive
-faster switching
z Low drain to tab capacitance(<30pF)
z Low RDS (on) HDMOSTM process
z Rugged polysilicon gate cell structure
z Rated for Unclamped Inductive Load
Switching (UIS)
z Fast intrinsic Rectifier
Applications
z DC-DC converters
z Battery chargers
z Switched-mode and resonant-mode
power supplies
z DC choppers
z AC motor control
Advantages
z Easy assembly
z Space savings
z High power density
© 2003 IXYS All rights reserved
DS98723B(01/03)