JANSR2N7404 Datasheet, PDF (6/8 Pages) Intersil Corporation – 15A, -200V, 0.290 Ohm, Rad Hard, P-Channel Power MOSFET

JANSR2N7404
Screening Information
Screening is performed in accordance with the latest revision in effect of MIL-S-19500, (Screening Information Table).
Delta Tests and Limits (JANS) T_C = 25^oC, Unless Otherwise Specified
PARAMETER
SYMBOL
TEST CONDITIONS
MAX
Gate to Source Leakage Current
I_GSS
Zero Gate Voltage Drain Current
I_DSS
On Resistance
r_DS(ON)
Gate Threshold Voltage
V_GS(TH)
NOTES:
7. Or 100% of Initial Reading (whichever is greater).
8. Of Initial Reading.
V_GS = ±20V
V_DS = 80% Rated Value
T_C = 25^oC at Rated I_D
I_D = 1.0mA
±20 (Note 7)
±25 (Note 7)
±20% (Note 8)
±20% (Note 8)
Screening Information
TEST
Gate Stress
Pind
Pre Burn-In Tests (Note 9)
Steady State Gate
Bias (Gate Stress)
Interim Electrical Tests (Note 9)
Steady State Reverse
Bias (Drain Stress)
PDA
Final Electrical Tests (Note 9)
NOTE:
9. Test limits are identical pre and post burn-in.
JANS
V_GS = -30V, t = 250µs
Required
MIL-S-19500 Group A,
Subgroup 2 (All Static Tests at 25^oC)
MIL-STD-750, Method 1042, Condition B
V_GS = 80% of Rated Value,
T_A = 150^oC, Time = 48 hours
All Delta Parameters Listed in the Delta Tests and Limits Table
MIL-STD-750, Method 1042, Condition A
V_DS
T_A =
= 80% of Rated Value,
150^oC, Time = 240 hours
5%
MIL-S-19500, Group A,
Subgroups 2 and 3
Additional Screening Tests
PARAMETER
Safe Operating Area
Unclamped Inductive Switching
Thermal Response
Thermal Impedance
SYMBOL
SOA
I_AS
∆V_SD
∆V_SD
TEST CONDITIONS
V_DS = -160V, t = 10ms
V_GS(PEAK) = -15V, L = 0.1mH
t_H = 100ms; V_H = -25V; I_H = 4A
t_H = 500ms; V_H = -25V; I_H = 4A
MAX
2.91
45
136
187
UNITS
nA
µA
Ω
V
UNITS
A
A
mV
mV
2-81