ISL58792 Datasheet, PDF (6/16 Pages) Intersil Corporation – Laser Diode Driver with Serial Control and Write Current DAC

ISL58792
PMAX DAC (10-bit) DC Specifications Standard conditions apply unless otherwise noted.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
MAX
(Note 13) TYP (Note 13) UNIT
DNL-PMAX
Differential Non-Linearity
(Note 7)
-3.5
+3.5
LSB
INL-PMAX
Integral Non-Linearity
At 200h Resistive Load ~0V to ~3V
+40
LSB
ZS-PMAX
Zero-Scale Error
(Note 8)
-2
0
+2
LSB
V_RSET
RSET Pin Voltage
1.03
1.06 1.11
V
NOTES:
7. Differential non-linearity (DNL) is the differential between the measured and ideal 1 LSB change of any two adjacent codes.
8. Zero-scale error (ZS) is the deviation from zero current output when the digital input code is zero.
IOUT1/2 Write Power DAC (10-bit) DC Specifications Standard conditions apply unless otherwise noted.
PARAMETER
DESCRIPTION
CONDITIONS
MIN
MAX
(Note 13) TYP (Note 13)
UNIT
DNL-W
Differential Non-Linearity
-1.7
+1.0
LSB
INL-W
Integral Non-Linearity
At 200h Resistive Load
~0V to ~3V
+21
LSB
FS_OUT-W620 Write DAC Full-Scale Output Current
WriteDAC = 0x3FF. Headroom depends
475
525
mA
R_SET = 620
on I_OUT
FS_OUT-H1.1
Write DAC Full-Scale Output Current
WriteDAC = 0x3FF,
Fixed Headroom = 1.1V
700
800
875
mA
PSRR_-FS
Power Supply Rejection - Full-Scale
Current
vs V_SO (Note 9)
-30
dB
TC_-FS-IOUT
ZS-W
Temperature Coefficient - Full-Scale Current (Note 10) 0°C to +85°C
Zero-scale Error
(Note 11)
-32
ppm/C
-2
0
+2
LSB
R_OUT-WDAC
Write DAC Output Series Resistance
WriteDAC = PMAX = 0x3FF
PMAX bias overdriven (Note 12)
1.1
1.4

NOTES:
9. Full scale output current power supply sensitivity (SFS) is measured by varying the V_SO from 4.5V to 5.5V DC and measuring the effect of this signal
on the full-scale output current.
10. Full scale output current temperature coefficient (TFS) is given by delta (full scale output current)/(T).
11. Zero-scale error (ZS) is the deviation from zero current output when the digital input code is zero.
12. PMAX bias overdriven via R_SET.
13. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
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6
FN7580.3
December 14, 2015