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ISL3232E_14 Datasheet, PDF (6/14 Pages) Intersil Corporation – QFN Packaged, ±15kV ESD Protected,+2.7V to +5.5V, 150nA, 250kbps, RS-232 Transmitters/Receivers
ISL3232E, ISL4221E, ISL4223E
Electrical Specifications
PARAMETER
Test Conditions: VCC = 3V to 5.5V, C1 through C4 = 0.1µF; Unless Otherwise Specified.
Typicals are at TA = +25°C (Continued)
TEST CONDITIONS
TEMP MIN
(°C) (Note 4) TYP
MAX
(Note 4) UNITS
RECEIVER INPUTS
Input Voltage Range
25
-25
-
25
V
Input Threshold Low
Input Threshold High
Input Hysteresis
VCC = 3.3V
VCC = 5.0V
VCC = 3.3V
VCC = 5.0V
25
0.6
1.2
-
V
25
0.8
1.5
-
V
25
-
1.5
2.4
V
25
-
1.8
2.4
V
25
-
0.5
-
V
Input Resistance
25
3
5
7
kΩ
TRANSMITTER OUTPUTS
Output Voltage Swing
All Transmitter Outputs Loaded with 3kΩ to Ground
Full ±5.0
±5.4
-
V
Output Resistance
Output Short-Circuit Current
VCC = V+ = V- = 0V, Transmitter Output = ±2V
Full
300
Full
-
10M
±35
-
Ω
±60
mA
Output Leakage Current
VOUT = ±12V, VCC = 0V, or VCC = 3V to 5.5V,
Full
-
with Automatic Power-down or FORCEOFF = GND
-
±25
µA
TIMING CHARACTERISTICS
Maximum Data Rate
Receiver Propagation Delay
Receiver Output Enable Time
RL = 3kΩ, CL = 1000pF, One Transmitter Switching
Full
250
500
Receiver Input to Receiver
Output, CL = 150pF
tPHL
tPLH
25
-
0.15
25
-
0.15
Normal Operation (Except ISL3232E)
25
-
200
-
kbps
-
µs
-
µs
-
ns
Receiver Output Disable Time
Normal Operation (Except ISL3232E)
25
-
200
-
ns
Transmitter Skew
Receiver Skew
Transition Region Slew Rate
tPHL - tPLH (Note 3)
tPHL - tPLH
VCC = 3.3V, RL = 3kΩ to 7kΩ,
Measured From 3V to -3V
or -3V to 3V
CL = 150pF to
2500pF
CL = 150pF to
1000pF
25
-
25
-
25
4
25
6
100
-
ns
50
-
ns
-
30
V/µs
-
30
V/µs
ESD PERFORMANCE
RS-232 Pins (TOUT, RIN)
Human Body Model
25
-
±15
-
kV
IEC61000-4-2 Contact Discharge
25
-
±8
-
kV
IEC61000-4-2 Air Gap Discharge
25
-
±15
-
kV
All Other Pins
Human Body Model
25
-
±2
-
kV
NOTES:
3. Transmitter skew is measured at the transmitter zero crossing points.
4. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.
6
FN6045.6
May 13, 2010