HCS283MS Datasheet, PDF (6/9 Pages) Intersil Corporation – Radiation Hardened 4-Bit Full Adder with Fast Carry

Specifications HCS283MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
Initial Test (Preburn-In)
100%/5004
1, 7, 9
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
READ AND RECORD
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
PRE RAD
Group E Subgroup 2
5005
1, 7, 9
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TEST
POST RAD
Table 4
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
2, 3, 5 - 8, 11, 12, 14, 15
-
16
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
8
-
2, 3, 5 - 7, 11, 12,
14, 15, 16
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
8
1, 4, 9, 10, 13
16
NOTES:
1. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1kΩ ± 5% for dynamic burn-in
OSCILLATOR
50kHz
25kHz
-
-
-
-
2, 6, 7, 11, 15
3, 5, 12, 14
TABEL 9. IRRADIATION TEST CONNECTIONS (T_A = +25^oC, ±5^oC)
OPEN
GROUND
VCC = 5V ± 0.5V
1, 4, 9, 10, 13
8
2, 3, 5 - 7, 11, 12, 14 - 16
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518850
6