CD40208BMS Datasheet, PDF (6/11 Pages) Intersil Corporation – CMOS 4 x 4 Multiport Register

Specifications CD40208BMS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
Static Burn-In 1
(Note 1)
OPEN
1, 2, 4-7, 22, 23
GROUND
3, 8-21
VDD
24
9V ± -0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 2 1, 2, 4-7, 22, 23
(Note 1)
12
3, 8-11, 13-21, 24
Dynamic Burn-
In (Note 1)
12
3, 15, 16, 21, 24 1, 2, 4-7, 22, 23 8, 10, 14, 19, 20 9, 11, 13, 17, 18
Irradiation
(Note 2)
1, 2, 4-7, 22, 23
12
3, 8-11, 13-21, 24
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
Block Diagram
CL
WE
DATA
INPUTS
W0 W1 R0A R1A R0B R1B
DEC.
DEC.
DEC. ^{ENABLE A}
Q0A
Q1A
WORD A
Q2A
OUTPUT
D0
Q3A
D1
4X4
D2
MEMORY
Q0B
D3
Q1B
WORD B
Q2B
OUTPUT
Q3B
FIGURE 1.
ENABLE B
7-1436