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CD4000BMS Datasheet, PDF (6/9 Pages) Intersil Corporation – CMOS NOR Gate
Specifications CD4000BMS, CD4001BMS, CD4002BMS, CD4025BMS
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
PART NUMBER CD4000BMS
Static Burn-In 1 1, 2, 6, 9, 10 3 - 5, 7, 8, 11 - 13
14
Note 1
Static Burn-In 2
Note 1
1, 2, 6, 9, 10
7
3 - 5, 8, 11 - 14
Dynamic Burn-
1, 2
7
In Note 1
14
6, 9, 10
3 - 5, 8, 11 - 13
Irradiation
Note 2
1, 2, 6, 9, 10
7
3 - 5, 8, 11 - 14
PART NUMBER CD4001BMS
Static Burn-In 1
3, 4, 10, 11
1, 2, 5 - 9, 12, 13
14
Note 1
Static Burn-In 2
Note 1
3, 4, 10, 11
7
1, 2, 5, 6, 8, 9,
12 - 14
Dynamic Burn-
-
In Note 1
7
14
3, 4, 10, 11
1, 2, 5, 6, 8, 9,
12, 13
Irradiation
Note 2
3, 4, 10, 11
7
1, 2, 5, 6, 8, 9,
12 - 14
PART NUMBER CD4002BMS
Static Burn-In 1
1, 6, 8, 13
2 - 5, 7, 9 - 12
14
Note 1
Static Burn-In 2
Note 1
1, 6, 8, 13
7
2 - 5, 9 - 12, 14
Dynamic Burn-
6, 8
7
In Note 1
14
1, 13
2 - 5, 9 - 12
Irradiation
Note 2
1, 6, 8, 13
7
2 - 5, 9 - 12, 14
PART NUMBER CD4025BMS
Static Burn-In 1
6, 9, 10
1 - 5, 7, 8, 11 - 13
14
Note 1
Static Burn-In 2
Note 1
6, 9, 10
7
1 - 5, 8, 11 - 14
Dynamic Burn-
-
In Note 1
7
14
6, 9, 10
1 - 5, 8, 11 - 13
Irradiation
Note 2
6, 9, 10
7
1 - 5, 8, 11 - 14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V ± 0.5V
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